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M. Hashimoto, W. Liao, and S. Hirokawa, "Soft Error Rate Estimation with TCAD and Machine Learning (Invited)," Proceedings of International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), September 2017. | |
ID | 459 |
分類 | 国際会議 |
タグ | error estimation invited learning machine rate soft tcad |
表題 (title) |
Soft Error Rate Estimation with TCAD and Machine Learning (Invited) |
表題 (英文) |
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著者名 (author) |
M. Hashimoto,W. Liao,S. Hirokawa |
英文著者名 (author) |
M. Hashimoto,W. Liao,S. Hirokawa |
キー (key) |
M. Hashimoto,W. Liao,S. Hirokawa |
定期刊行物名 (journal) |
Proceedings of International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) |
定期刊行物名 (英文) |
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巻数 (volume) |
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号数 (number) |
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ページ範囲 (pages) |
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刊行月 (month) |
9 |
出版年 (year) |
2017 |
Impact Factor (JCR) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | pdf (application/pdf) [一般閲覧可] |
BiBTeXエントリ |
@article{id459, title = {Soft Error Rate Estimation with {TCAD} and Machine Learning (Invited)}, author = {M. Hashimoto and W. Liao and S. Hirokawa}, journal = {Proceedings of International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)}, month = {9}, year = {2017}, } |