: M. Hashimoto, W. Liao, and S. Hirokawa, Soft Error Rate Estimation with TCAD and Machine Learning (Invited), September 2017.
Detail of a work
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| M. Hashimoto, W. Liao, and S. Hirokawa, "Soft Error Rate Estimation with TCAD and Machine Learning (Invited)," Proceedings of International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), September 2017. | |
| ID | 459 |
| 分類 | 国際会議 |
| タグ | error estimation invited learning machine rate soft tcad |
| 表題 (title) |
Soft Error Rate Estimation with TCAD and Machine Learning (Invited) |
| 表題 (英文) |
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| 著者名 (author) |
M. Hashimoto,W. Liao,S. Hirokawa |
| 英文著者名 (author) |
M. Hashimoto,W. Liao,S. Hirokawa |
| キー (key) |
M. Hashimoto,W. Liao,S. Hirokawa |
| 定期刊行物名 (journal) |
Proceedings of International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
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| 号数 (number) |
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| ページ範囲 (pages) |
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| 刊行月 (month) |
9 |
| 出版年 (year) |
2017 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | pdf (application/pdf) [一般閲覧可] |
| BiBTeXエントリ |
@article{id459,
title = {Soft Error Rate Estimation with {TCAD} and Machine Learning (Invited)},
author = {M. Hashimoto and W. Liao and S. Hirokawa},
journal = {Proceedings of International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)},
month = {9},
year = {2017},
}
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