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この検索内の頻出タグ: 12-nm:1 analysis:1 finfet:1 multi-cell:1 multiple-cell:1 parasitic-bipolar-effect-induced:1 sram:1 tcad:1 upsets:1

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国際会議
[1] Ryuichi Yasuda, Koichi Fukuda, Junichi Hattori, Kozo Takeuchi, Kozo Takeuchi, and Masanori Hashimoto, "Multi-Cell TCAD Analysis of Parasitic-Bipolar-Effect-Induced Multiple-Cell Upsets in a 12-nm FinFET SRAM," Proceedings of International Conference on Integrated Circuits, Design and Verification (ICDV), 採録済.