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Y. Ogasahara, M. Hashimoto, and T. Onoye, "Dynamic Supply Noise Measurement Circuit Composed of Standard Cells Suitable for In-Site SoC Power Integrity Verification," Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pp. 107--108, January 2008.
ID 192
分類 国際会議
タグ cells circuit composed dynamic in-site integrity measurement noise power soc standard suitable supply verification
表題 (title) Dynamic Supply Noise Measurement Circuit Composed of Standard Cells Suitable for In-Site SoC Power Integrity Verification
表題 (英文)
著者名 (author) Y. Ogasahara,M. Hashimoto,T. Onoye
英文著者名 (author) Y. Ogasahara,M. Hashimoto,T. Onoye
キー (key) Y. Ogasahara,M. Hashimoto,T. Onoye
定期刊行物名 (journal) Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC)
定期刊行物名 (英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages) 107--108
刊行月 (month) 1
出版年 (year) 2008
Impact Factor (JCR)
URL
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル 97.pdf (application/pdf) [一般閲覧可]
BiBTeXエントリ
@article{id192,
         title = {Dynamic Supply Noise Measurement Circuit Composed of Standard Cells Suitable for In-Site {SoC} Power Integrity Verification},
        author = {Y. Ogasahara and M. Hashimoto and T. Onoye},
       journal = {Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC)},
         pages = {107--108},
         month = {1},
          year = {2008},
}