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R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "SET Pulse-Width Measurement Eliminating Pulse-Width Modulation and Within-Die Process Variation Effects," Proceedings of International Reliability Physics Symposium (IRPS), April 2012.
ID 315
分類 国際会議
タグ effects eliminating measurement modulation process pulse-width set variation within-die
表題 (title) SET Pulse-Width Measurement Eliminating Pulse-Width Modulation and Within-Die Process Variation Effects
表題 (英文)
著者名 (author) R. Harada,Y. Mitsuyama,M. Hashimoto,T. Onoye
英文著者名 (author) R. Harada,Y. Mitsuyama,M. Hashimoto,T. Onoye
キー (key) R. Harada,Y. Mitsuyama,M. Hashimoto,T. Onoye
定期刊行物名 (journal) Proceedings of International Reliability Physics Symposium (IRPS)
定期刊行物名 (英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages)
刊行月 (month) 4
出版年 (year) 2012
Impact Factor (JCR)
URL
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル 168.PDF (application/pdf) [一般閲覧可]
BiBTeXエントリ
@article{id315,
         title = {{SET} Pulse-Width Measurement Eliminating Pulse-Width Modulation and Within-die Process Variation Effects},
        author = {R. Harada and Y. Mitsuyama and M. Hashimoto and T. Onoye},
       journal = {Proceedings of International Reliability Physics Symposium (IRPS)},
         month = {4},
          year = {2012},
}