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R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "SET Pulse-Width Measurement Suppressing Pulse-Width Modulation and Within-Die Process Variation Effects," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, E97-A(7), pp. 1461--1467, July 2014.
ID 376
分類 論文誌
タグ effects measurement modulation process pulse-width set suppressing variation within-die
表題 (title) SET Pulse-Width Measurement Suppressing Pulse-Width Modulation and Within-Die Process Variation Effects
表題 (英文)
著者名 (author) R. Harada,Y. Mitsuyama,M. Hashimoto,T. Onoye
英文著者名 (author) R. Harada,Y. Mitsuyama,M. Hashimoto,T. Onoye
キー (key) R. Harada,Y. Mitsuyama,M. Hashimoto,T. Onoye
定期刊行物名 (journal) IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences
定期刊行物名 (英文)
巻数 (volume) E97-A
号数 (number) 7
ページ範囲 (pages) 1461--1467
刊行月 (month) 7
出版年 (year) 2014
Impact Factor (JCR)
URL
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル 200.pdf (application/pdf) [一般閲覧可]
BiBTeXエントリ
@article{id376,
         title = {{SET} Pulse-Width Measurement Suppressing Pulse-Width Modulation and Within-die Process Variation Effects},
        author = {R. Harada and Y. Mitsuyama and M. Hashimoto and T. Onoye},
       journal = {IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences},
        volume = {E97-A},
        number = {7},
         pages = {1461--1467},
         month = {7},
          year = {2014},
}