Detail of a work
Tweet | |
H. Fuketa, R. Harada, M. Hashimoto, and T. Onoye, "Measurement and Analysis of Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 10T Subthreshold SRAM," IEEE Transactions on Device and Materials Reliability, 14(1), 463 -- 470, March 2014. | |
ID | 345 |
分類 | 論文誌 |
タグ | 10t alpha-particle-induced analysis cell errors measurement multiple soft sram subthreshold upsets |
表題 (title) |
Measurement and Analysis of Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 10T Subthreshold SRAM |
表題 (英文) |
|
著者名 (author) |
H. Fuketa,R. Harada,M. Hashimoto,T. Onoye |
英文著者名 (author) |
H. Fuketa,R. Harada,M. Hashimoto,T. Onoye |
キー (key) |
H. Fuketa,R. Harada,M. Hashimoto,T. Onoye |
定期刊行物名 (journal) |
IEEE Transactions on Device and Materials Reliability |
定期刊行物名 (英文) |
|
巻数 (volume) |
14 |
号数 (number) |
1 |
ページ範囲 (pages) |
463 -- 470 |
刊行月 (month) |
3 |
出版年 (year) |
2014 |
Impact Factor (JCR) |
|
URL |
|
付加情報 (note) |
|
注釈 (annote) |
|
内容梗概 (abstract) |
|
論文電子ファイル | 185.pdf (application/pdf) [一般閲覧可] |
BiBTeXエントリ |
@article{id345, title = {Measurement and Analysis of {Alpha-Particle-Induced} Soft Errors and Multiple Cell Upsets in {10T} Subthreshold {SRAM}}, author = {H. Fuketa and R. Harada and M. Hashimoto and T. Onoye}, journal = {IEEE Transactions on Device and Materials Reliability}, volume = {14}, number = {1}, pages = {463 -- 470}, month = {3}, year = {2014}, } |