Table of works
Frequent tags in this search: set:8 measurement:6 modulation:4 pulse-width:4 impact:3 acquiring:2 circuits:2 distribution:2 effects:2 framework:2 injection:2 process:2 pulse:2 resolution:2 sub-fo1-inverter-delay:2 variation:2 width:2 within-die:2 :1 comprehensive:1 eliminating:1 evaluation:1 exhaustive:1 fault:1 fiawase:1 hybrid:1 nbti-induced:1 nbti-induced:1 processor-scale:1 simulation-emulation:1
8 publications are found. : URL for this page. : HTML
| Author (author) | Title (title) | Journal/Conference | Volume / Number | Pages (pages) | Published date | Impact factor / Acceptance | File | |
|---|---|---|---|---|---|---|---|---|
| Academic Journal |
R. Harada, Y. Mitsuyama, M. Hashimoto, T. Onoye |
SET Pulse-Width Measurement Suppressing Pulse-Width Modulation and Within-Die Process Variation Effects |
IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences | E97-A(7) |
1461--1467 |
July 2014 |
200.pdf | |
| Academic Journal |
R. Harada, Y. Mitsuyama, M. Hashimoto, T. Onoye |
Impact of NBTI-Induced Pulse-Width Modulation on SET Pulse-Width Measurement |
IEEE Transactions on Nuclear Science | 60(4) |
2630--2634 |
August 2013 |
180.pdf | |
| Academic Journal |
R. Harada, Y. Mitsuyama, M. Hashimoto, T. Onoye |
Measurement Circuits for Acquiring SET Pulse Width Distribution with Sub-FO1-inverter-delay Resolution |
IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences | E93-A(12) |
2417--2423 |
December 2010 |
149.pdf | |
| International Conference |
|
FIawase: a SET Fault Injection Framework Towards Exhaustive System-Level Impact Evaluation |
Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC) | (accepted, to appear) |
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| International Conference |
R. Harada, Y. Mitsuyama, M. Hashimoto, T. Onoye |
Impact of NBTI-Induced Pulse-Width Modulation on SET Pulse-Width Measurement |
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS) | September 2012 |
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| International Conference |
R. Harada, Y. Mitsuyama, M. Hashimoto, T. Onoye |
SET Pulse-Width Measurement Eliminating Pulse-Width Modulation and Within-Die Process Variation Effects |
Proceedings of International Reliability Physics Symposium (IRPS) | April 2012 |
168.PDF | |||
| International Conference |
R. Harada, Y. Mitsuyama, M. Hashimoto, T. Onoye |
Measurement Circuits for Acquiring SET Pulse Width Distribution with Sub-FO1-inverter-delay Resolution |
Proceedings of International Symposium on Quality Electronic Design (ISQED) | 839--844 |
March 2010 |
138.pdf | ||
| Domestic Conference |
張明涛，程全，橋本昌宜 |
Hybrid Simulation-Emulation Framework for Comprehensive Processor-Scale Set Injection |
情報処理学会DAシンポジウム | August 2025 |