この検索内の頻出タグ: set^:8 measurement^:6 modulation^:4 pulse-width^:4 impact^:3 acquiring^:2 circuits^:2 distribution^:2 effects^:2 framework^:2 injection^:2 process^:2 pulse^:2 resolution^:2 sub-fo1-inverter-delay^:2 variation^:2 width^:2 within-die^{:2 :1} comprehensive^:1 eliminating^:1 evaluation^:1 exhaustive^:1 fault^:1 fiawase^:1 hybrid^:1 nbti-induced^:1 nbti-­induced^:1 processor-scale^:1 simulation-emulation^:1

8 件の該当がありました． : このページのURL : HTML

論文誌

[1] R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "SET Pulse-Width Measurement Suppressing Pulse-Width Modulation and Within-Die Process Variation Effects," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E97-A, number 7, pages 1461--1467, July 2014. [200.pdf]

[2] R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Impact of NBTI-Induced Pulse-Width Modulation on SET Pulse-Width Measurement," IEEE Transactions on Nuclear Science, volume 60, number 4, pages 2630--2634, August 2013. [180.pdf]

[3] R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Measurement Circuits for Acquiring SET Pulse Width Distribution with Sub-FO1-inverter-delay Resolution," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E93-A, number 12, pages 2417--2423, December 2010. [149.pdf]

国際会議

[1] Mingtao Zhang, Quan Cheng, and Masanori Hashimoto, "FIawase: a SET Fault Injection Framework Towards Exhaustive System-Level Impact Evaluation," Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), 採録済.

[2] R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Impact of NBTI-­Induced Pulse-Width Modulation on SET Pulse-Width Measurement," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2012.

[3] R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "SET Pulse-Width Measurement Eliminating Pulse-Width Modulation and Within-Die Process Variation Effects," Proceedings of International Reliability Physics Symposium (IRPS), April 2012. [168.PDF]

[4] R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Measurement Circuits for Acquiring SET Pulse Width Distribution with Sub-FO1-inverter-delay Resolution," Proceedings of International Symposium on Quality Electronic Design (ISQED), pages 839--844, March 2010. [138.pdf]

国内会議(査読付き)

[1] 張明涛，程全，橋本昌宜, "Hybrid Simulation-Emulation Framework for Comprehensive Processor-Scale Set Injection," 情報処理学会DAシンポジウム, 2025年8月.