この検索内の頻出タグ: deep^:3 networks^:2 neural^:2 accelerator^:1 cmos^:1 compact^:1 compatible^:1 current^:1 event^:1 exploration^:1 explorations^:1 flow^:1 hall^:1 horizontal^:1 leveraging^:1 meets^:1 multi-bit-width^:1 multi-precision^:1 n-well^:1 observations^:1 process^:1 reliability^:1 remedies^:1 sensor^:1 single^:1 standard^:1 system-on-chip^:1 triaxial^:1 upset^:1 vertical^:1

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論文誌

[1] Yuhao Wang, Toshihisa Tanaka, Tomochika Harada, Masanori Hashimoto, and Ryo Shirai, "A Compact Triaxial Hall Sensor Compatible with Standard Cmos Process Leveraging Horizontal and Vertical Current Flow within Deep N-Well," IEEE Sensors Journal, 採録済. [pdf]

[2] Q. Cheng, M. Huang, C. Man, A. Shen, L. Dai, H. Yu, and M. Hashimoto, "Reliability Exploration of System-On-Chip with Multi-Bit-Width Accelerator for Multi-Precision Deep Neural Networks," IEEE Transactions on Circuits and Systems I: Regular Papers, volume 70, number 10, 3978 -- 3991, October 2023. [pdf]

国際会議

[1] Z. Yan, Y. Shi, W. Liao, M. Hashimoto, X. Zhou, and C. Zhuo, "When Single Event Upset Meets Deep Neural Networks: Observations, Explorations, and Remedies," Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), January 2020. [pdf]