Table of works
Frequent tags in this search: upset:6 event:5 single:5 induced:3 cross-section:2 direct:2 impact:2 ionization:2 method:2 prediction:2 proton:2 20:1 autonomous:1 behavior:1 bit:1 cram:1 deep:1 dose:1 driving:1 electronic:1 erroneous:1 explorations:1 feram:1 fpga:1 image-based:1 investigation:1 ionizing:1 lane:1 medical:1 meets:1
6 publications are found. : URL for this page. : HTML
| Author (author) | Title (title) | Journal/Conference | Volume / Number | Pages (pages) | Published date | Impact factor / Acceptance | File | |
|---|---|---|---|---|---|---|---|---|
| Academic Journal |
, , , T. Kato, , , , , M. Hashimoto |
Cross-Section Prediction Method for Proton Direct Ionization Induced Single Event Upset |
IEEE Transactions on Nuclear Science | 72(8) |
2735 - 2742 |
August 2025 |
pdf | |
| Academic Journal |
, W. Liao, M. Hashimoto, Y. Mitsuyama |
Impact of Neutron-Induced SEU in FPGA CRAM on Image-Based Lane Tracking for Autonomous Driving: from Bit Upset to SEFI and Erroneous Behavior |
IEEE Transactions on Nuclear Science | 69(1) |
35--42 |
January 2022 |
pdf | |
| International Conference |
|
Cross-Section Prediction Method for Proton Direct Ionization Induced Single Event Upset |
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS) | September 2024 |
||||
| International Conference |
, , W. Liao, M. Hashimoto |
When Single Event Upset Meets Deep Neural Networks: Observations, Explorations, and Remedies |
Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC) | January 2020 |
pdf | |||
| International Conference |
T. Uemura, T. Kato, S. Okano, H. Matsuyama, M. Hashimoto |
Impact of Package on Neutron Induced Single Event Upset in 20 nm SRAM |
Proceedings of International Symposium on Reliability Physics (IRPS) | April 2015 |
215.pdf | |||
| International Conference |
T. Uemura, M. Hashimoto |
Investigation of Single Event Upset and Total Ionizing Dose in FeRAM for Medical Electronic Tag |
Proceedings of International Symposium on Reliability Physics (IRPS) | April 2015 |
216.pdf |