List of works
この検索内の頻出タグ: upset:6 event:5 single:5 induced:3 cross-section:2 direct:2 impact:2 ionization:2 method:2 prediction:2 proton:2 20:1 autonomous:1 behavior:1 bit:1 cram:1 deep:1 dose:1 driving:1 electronic:1 erroneous:1 explorations:1 feram:1 fpga:1 image-based:1 investigation:1 ionizing:1 lane:1 medical:1 meets:1
- 論文誌
- [1] K. Takeuchi, K. Sakamoto, Y. Tsuchiya, T. Kato, R. Nakamura, A. Takeyama, T. Makino, T. Ohshima, M. Hashimoto, and H. Shindo, "Cross-Section Prediction Method for Proton Direct Ionization Induced Single Event Upset," IEEE Transactions on Nuclear Science, volume 72, number 8, 2735 - 2742, August 2025. [pdf]
- [2] T. Tanaka, W. Liao, M. Hashimoto, and Y. Mitsuyama, "Impact of Neutron-Induced SEU in FPGA CRAM on Image-Based Lane Tracking for Autonomous Driving: from Bit Upset to SEFI and Erroneous Behavior," IEEE Transactions on Nuclear Science, volume 69, number 1, pages 35--42, January 2022. [pdf]
- 国際会議
- [1] K. Takeuchi, K. Sakamoto, Y. Tsuchiya, T. Kato, R. Nakamura, A. Takeyama, T. Makino, T. Ohshima, M. Hashimoto, and H. Shindo, "Cross-Section Prediction Method for Proton Direct Ionization Induced Single Event Upset," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2024.
- [2] Z. Yan, Y. Shi, W. Liao, M. Hashimoto, X. Zhou, and C. Zhuo, "When Single Event Upset Meets Deep Neural Networks: Observations, Explorations, and Remedies," Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), January 2020. [pdf]
- [3] T. Uemura, T. Kato, S. Okano, H. Matsuyama, and M. Hashimoto, "Impact of Package on Neutron Induced Single Event Upset in 20 nm SRAM," Proceedings of International Symposium on Reliability Physics (IRPS), April 2015. [215.pdf]
- [4] T. Uemura and M. Hashimoto, "Investigation of Single Event Upset and Total Ionizing Dose in FeRAM for Medical Electronic Tag," Proceedings of International Symposium on Reliability Physics (IRPS), April 2015. [216.pdf]