Detail of a work
Tweet | |
T. Uemura and M. Hashimoto, "Investigation of Single Event Upset and Total Ionizing Dose in FeRAM for Medical Electronic Tag," Proceedings of International Symposium on Reliability Physics (IRPS), April 2015. | |
ID | 401 |
分類 | 国際会議 |
タグ | dose electronic event feram investigation ionizing medical single tag total upset |
表題 (title) |
Investigation of Single Event Upset and Total Ionizing Dose in FeRAM for Medical Electronic Tag |
表題 (英文) |
|
著者名 (author) |
T. Uemura,M. Hashimoto |
英文著者名 (author) |
T. Uemura,M. Hashimoto |
キー (key) |
T. Uemura,M. Hashimoto |
定期刊行物名 (journal) |
Proceedings of International Symposium on Reliability Physics (IRPS) |
定期刊行物名 (英文) |
|
巻数 (volume) |
|
号数 (number) |
|
ページ範囲 (pages) |
|
刊行月 (month) |
4 |
出版年 (year) |
2015 |
Impact Factor (JCR) |
|
URL |
|
付加情報 (note) |
|
注釈 (annote) |
|
内容梗概 (abstract) |
|
論文電子ファイル | 216.pdf (application/pdf) [一般閲覧可] |
BiBTeXエントリ |
@article{id401, title = {Investigation of Single Event Upset and Total Ionizing Dose in {FeRAM} for Medical Electronic Tag}, author = {T. Uemura and M. Hashimoto}, journal = {Proceedings of International Symposium on Reliability Physics (IRPS)}, month = {4}, year = {2015}, } |