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T. Tanaka, W. Liao, M. Hashimoto, and Y. Mitsuyama, "Impact of Neutron-Induced SEU in FPGA CRAM on Image-Based Lane Tracking for Autonomous Driving: from Bit Upset to SEFI and Erroneous Behavior," IEEE Transactions on Nuclear Science, 69(1), pp. 35--42, January 2022.
ID 582
分類 論文誌
タグ autonomous behavior bit cram driving erroneous fpga image-based impact lane neutron-induced sefi seu tracking upset
表題 (title) Impact of Neutron-Induced SEU in FPGA CRAM on Image-Based Lane Tracking for Autonomous Driving: from Bit Upset to SEFI and Erroneous Behavior
表題 (英文)
著者名 (author) T. Tanaka,W. Liao,M. Hashimoto,Y. Mitsuyama
英文著者名 (author) ,W. Liao,M. Hashimoto,Y. Mitsuyama
キー (key) ,W. Liao,M. Hashimoto,Y. Mitsuyama
定期刊行物名 (journal) IEEE Transactions on Nuclear Science
定期刊行物名 (英文)
巻数 (volume) 69
号数 (number) 1
ページ範囲 (pages) 35--42
刊行月 (month) 1
出版年 (year) 2022
Impact Factor (JCR)
URL
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル pdf (application/pdf) [一般閲覧可]
BiBTeXエントリ
@article{id582,
         title = {Impact of Neutron-induced {SEU} in {FPGA} {CRAM} on Image-based Lane Tracking for Autonomous Driving: from Bit Upset to {SEFI} and Erroneous Behavior},
        author = {T. Tanaka and W. Liao and M. Hashimoto and Y. Mitsuyama},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {69},
        number = {1},
         pages = {35--42},
         month = {1},
          year = {2022},
}