Detail of a work
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T. Tanaka, W. Liao, M. Hashimoto, and Y. Mitsuyama, "Impact of Neutron-Induced SEU in FPGA CRAM on Image-Based Lane Tracking for Autonomous Driving: from Bit Upset to SEFI and Erroneous Behavior," IEEE Transactions on Nuclear Science, 69(1), pp. 35--42, January 2022. | |
ID | 582 |
分類 | 論文誌 |
タグ | autonomous behavior bit cram driving erroneous fpga image-based impact lane neutron-induced sefi seu tracking upset |
表題 (title) |
Impact of Neutron-Induced SEU in FPGA CRAM on Image-Based Lane Tracking for Autonomous Driving: from Bit Upset to SEFI and Erroneous Behavior |
表題 (英文) |
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著者名 (author) |
T. Tanaka,W. Liao,M. Hashimoto,Y. Mitsuyama |
英文著者名 (author) |
,W. Liao,M. Hashimoto,Y. Mitsuyama |
キー (key) |
,W. Liao,M. Hashimoto,Y. Mitsuyama |
定期刊行物名 (journal) |
IEEE Transactions on Nuclear Science |
定期刊行物名 (英文) |
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巻数 (volume) |
69 |
号数 (number) |
1 |
ページ範囲 (pages) |
35--42 |
刊行月 (month) |
1 |
出版年 (year) |
2022 |
Impact Factor (JCR) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | pdf (application/pdf) [一般閲覧可] |
BiBTeXエントリ |
@article{id582, title = {Impact of Neutron-induced {SEU} in {FPGA} {CRAM} on Image-based Lane Tracking for Autonomous Driving: from Bit Upset to {SEFI} and Erroneous Behavior}, author = {T. Tanaka and W. Liao and M. Hashimoto and Y. Mitsuyama}, journal = {IEEE Transactions on Nuclear Science}, volume = {69}, number = {1}, pages = {35--42}, month = {1}, year = {2022}, } |