: B. Li, M. Hashimoto, and U. Schlichtmann, From Process Variations to Reliability: a Survey of Timing of Digital Circuits in the Nanometer Era (Invited), February 2018.
Detail of a work
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| B. Li, M. Hashimoto, and U. Schlichtmann, "From Process Variations to Reliability: a Survey of Timing of Digital Circuits in the Nanometer Era (Invited)," IPSJ Transactions on System LSI Design Methodology, 11, pp. 2--15, February 2018. | |
| ID | 465 |
| 分類 | 論文誌 |
| タグ | circuits digital era invited nanometer process reliability survey timing variations |
| 表題 (title) |
From Process Variations to Reliability: a Survey of Timing of Digital Circuits in the Nanometer Era (Invited) |
| 表題 (英文) |
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| 著者名 (author) |
B. Li,M. Hashimoto,U. Schlichtmann |
| 英文著者名 (author) |
B. Li,M. Hashimoto,U. Schlichtmann |
| キー (key) |
B. Li,M. Hashimoto,U. Schlichtmann |
| 定期刊行物名 (journal) |
IPSJ Transactions on System LSI Design Methodology |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
11 |
| 号数 (number) |
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| ページ範囲 (pages) |
2--15 |
| 刊行月 (month) |
2 |
| 出版年 (year) |
2018 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | 利用できません． |
| BiBTeXエントリ |
@article{id465,
title = {From Process Variations to Reliability: A Survey of Timing of Digital Circuits in the Nanometer Era (Invited)},
author = {B. Li and M. Hashimoto and U. Schlichtmann},
journal = {IPSJ Transactions on System LSI Design Methodology},
volume = {11},
pages = {2--15},
month = {2},
year = {2018},
}
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