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B. Li, M. Hashimoto, and U. Schlichtmann, "From Process Variations to Reliability: a Survey of Timing of Digital Circuits in the Nanometer Era (Invited)," IPSJ Transactions on System LSI Design Methodology, 11, pp. 2--15, February 2018. | |
ID | 465 |
分類 | 論文誌 |
タグ | circuits digital era invited nanometer process reliability survey timing variations |
表題 (title) |
From Process Variations to Reliability: a Survey of Timing of Digital Circuits in the Nanometer Era (Invited) |
表題 (英文) |
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著者名 (author) |
B. Li,M. Hashimoto,U. Schlichtmann |
英文著者名 (author) |
B. Li,M. Hashimoto,U. Schlichtmann |
キー (key) |
B. Li,M. Hashimoto,U. Schlichtmann |
定期刊行物名 (journal) |
IPSJ Transactions on System LSI Design Methodology |
定期刊行物名 (英文) |
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巻数 (volume) |
11 |
号数 (number) |
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ページ範囲 (pages) |
2--15 |
刊行月 (month) |
2 |
出版年 (year) |
2018 |
Impact Factor (JCR) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | 利用できません. |
BiBTeXエントリ |
@article{id465, title = {From Process Variations to Reliability: A Survey of Timing of Digital Circuits in the Nanometer Era (Invited)}, author = {B. Li and M. Hashimoto and U. Schlichtmann}, journal = {IPSJ Transactions on System LSI Design Methodology}, volume = {11}, pages = {2--15}, month = {2}, year = {2018}, } |