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この検索内の頻出タグ: circuits^:1 digital^:1 era^:1 invited^:1 nanometer^:1 process^:1 reliability^:1 survey^:1 timing^:1 variations^:1

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論文誌: [1] B. Li, M. Hashimoto, and U. Schlichtmann, "From Process Variations to Reliability: a Survey of Timing of Digital Circuits in the Nanometer Era (Invited)," IPSJ Transactions on System LSI Design Methodology, volume 11, pages 2--15, February 2018.