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論文誌

[1] B. Li, M. Hashimoto, and U. Schlichtmann, "From Process Variations to Reliability: a Survey of Timing of Digital Circuits in the Nanometer Era (Invited)," IPSJ Transactions on System LSI Design Methodology, volume 11, pages 2--15, February 2018.

[2] K. Shinkai, M. Hashimoto, and T. Onoye, "Extracting Device-Parameter Variations with RO-Based Sensors," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E94-A, number 12, pages 2537--2544, December 2011. [165.pdf]

国際会議

[1] K. Shinkai, M. Hashimoto, and T. Onoye, "Extracting Device-Parameter Variations with RO-Based Sensors," ACM International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), pages 13--18, March 2011.