Table of works
Frequent tags in this search: technology:5 circuit:2 cmos:2 driver:2 lcd:2 migration:2 sizing:2 transistor:2 128.4:1 22:1 292.2-to-321.4:1 applications:1 bulk:1 compute-intensive:1 contribution:1 dbc:1 ff:1 fpga:1 fsrms:1 generator:1 ghz:1 granularity-oriented:1 implementing:1 integrated:1 iterative:1 jitter:1 mapping:1 mux:1 nm:1 processor:1
5 publications are found. : URL for this page. : HTML
| Author (author) | Title (title) | Journal/Conference | Volume / Number | Pages (pages) | Published date | Impact factor / Acceptance | File | |
|---|---|---|---|---|---|---|---|---|
| Academic Journal |
, , , , , M. Hashimoto |
A 292.2-To-321.4 Ghz Synchronized Source Generator with ‒58.7 Dbc Spurious Tone and 128.4 Fsrms Integrated Jitter in 22 Nm Cmos Technology |
IEEE Transactions on Microwave Theory and Techniques | (accepted, to appear) |
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| Academic Journal |
M. Hashimoto, T. Ijichi, S. Takahashi, S. Tsukiyama, I. Shirakawa |
Transistor Sizing of LCD Driver Circuit for Technology Migration |
IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences | E90-A(12) |
2712--2717 |
December 2007 |
96.pdf | |
| International Conference |
T. Imagawa, J. Yu, M. Hashimoto, H. Ochi |
MUX Granularity-Oriented Iterative Technology Mapping for Implementing Compute-Intensive Applications on Via-Switch FPGA |
Proceedings of Design, Automation and Test in Europe Conference (DATE) | February 2021 |
pdf | |||
| International Conference |
T. Uemura, T. Kato, H. Matsuyama, M. Hashimoto |
Scaling Trend of SRAM and FF of Soft-Error Rate and Their Contribution to Processor Reliability on Bulk CMOS Technology |
IEEE Nuclear and Space Radiation Effects Conference (NSREC) | July 2013 |
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| International Conference |
T. Ijichi, M. Hashimoto, S. Takahashi, S. Tsukiyama, I. Shirakawa |
Transistor Sizing of LCD Driver Circuit for Technology Migration |
Proceedings of International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC) | 1 |
I25-I28 |
July 2006 |
28.pdf |