Academic Journal
|
, , , , , , , Y. Watanabe, S. Abe, W. Liao, M. Tampo, , , Y. Miyake, M. Hashimoto
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Muon-Induced SEU Analysis and Simulation for Different Cell Types in 12-nm FinFET SRAMs, and 28-nm Planar SRAMs and Register Files
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IEEE Transactions on Nuclear Science
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(accepted, to appear)
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|
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Academic Journal
|
H. Fuketa, R. Harada, M. Hashimoto, T. Onoye
|
Measurement and Analysis of Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 10T Subthreshold SRAM
|
IEEE Transactions on Device and Materials Reliability
| 14(1)
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463 -- 470
|
March 2014
|
| 185.pdf
|
Academic Journal
|
R. Harada, S. Abe, H. Fuketa, T. Uemura, M. Hashimoto, Y. Watanabe
|
Angular Dependency of Neutron Induced Multiple Cell Upsets in 65-nm 10T Subthreshold SRAM
|
IEEE Transactions on Nuclear Science
| 59(6)
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2791--2795
|
December 2012
|
| 175.pdf
|
Academic Journal
|
H. Fuketa, M. Hashimoto, Y. Mitsuyama, T. Onoye
|
Neutron-Induced Soft Errors and Multiple Cell Upsets in 65-nm 10T Subthreshold SRAM
|
IEEE Transactions on Nuclear Science
| 58(4)
|
2097--2102
|
August 2011
|
| 159.pdf
|
International Conference
|
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Muon-Induced SEU Analysis and Simulation for Different Cell Types in 12-nm FinFET SRAMs
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Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
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September 2024
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International Conference
|
R. Harada, S. Abe, H. Fuketa, T. Uemura, M. Hashimoto, Y. Watanabe
|
Angular Dependency of Neutron Induced Multiple Cell Upsets in 65-nm 10T Subthreshold SRAM
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IEEE Nuclear and Space Radiation Effects Conference (NSREC)
|
|
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July 2012
|
|
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International Conference
|
H. Fuketa, M. Hashimoto, Y. Mitsuyama, T. Onoye
|
Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 65-nm 10T Subthreshold SRAM
|
Proceedings of International Reliability Physics Symposium (IRPS)
|
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213--217
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May 2010
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| 140.PDF
|
International Conference
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M. Hashimoto, K. Fujimori, H. Onodera
|
Automatic Generation of Standard Cell Library in VDSM Technologies
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Proceedings of International Symposium on Quality Electronic Design (ISQED)
|
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36-41
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March 2004
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| 53.PDF
|
