Detail of a work
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| H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, "Neutron-Induced Soft Errors and Multiple Cell Upsets in 65-nm 10T Subthreshold SRAM," IEEE Transactions on Nuclear Science, 58(4), pp. 2097--2102, August 2011. | |
| ID | 302 |
| 分類 | 論文誌 |
| タグ | 10t 65-nm cell errors multiple neutron-induced soft sram subthreshold upsets |
| 表題 (title) |
Neutron-Induced Soft Errors and Multiple Cell Upsets in 65-nm 10T Subthreshold SRAM |
| 表題 (英文) |
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| 著者名 (author) |
H. Fuketa,M. Hashimoto,Y. Mitsuyama,T. Onoye |
| 英文著者名 (author) |
H. Fuketa,M. Hashimoto,Y. Mitsuyama,T. Onoye |
| キー (key) |
H. Fuketa,M. Hashimoto,Y. Mitsuyama,T. Onoye |
| 定期刊行物名 (journal) |
IEEE Transactions on Nuclear Science |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
58 |
| 号数 (number) |
4 |
| ページ範囲 (pages) |
2097--2102 |
| 刊行月 (month) |
8 |
| 出版年 (year) |
2011 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | 159.pdf (application/pdf) [一般閲覧可] |
| BiBTeXエントリ |
@article{id302,
title = {Neutron-Induced Soft Errors and Multiple Cell Upsets in {65-nm} {10T} Subthreshold {SRAM}},
author = {H. Fuketa and M. Hashimoto and Y. Mitsuyama and T. Onoye},
journal = {IEEE Transactions on Nuclear Science},
volume = {58},
number = {4},
pages = {2097--2102},
month = {8},
year = {2011},
}
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