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H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, "Neutron-Induced Soft Errors and Multiple Cell Upsets in 65-nm 10T Subthreshold SRAM," IEEE Transactions on Nuclear Science, 58(4), pp. 2097--2102, August 2011. | |
ID | 302 |
分類 | 論文誌 |
タグ | 10t 65-nm cell errors multiple neutron-induced soft sram subthreshold upsets |
表題 (title) |
Neutron-Induced Soft Errors and Multiple Cell Upsets in 65-nm 10T Subthreshold SRAM |
表題 (英文) |
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著者名 (author) |
H. Fuketa,M. Hashimoto,Y. Mitsuyama,T. Onoye |
英文著者名 (author) |
H. Fuketa,M. Hashimoto,Y. Mitsuyama,T. Onoye |
キー (key) |
H. Fuketa,M. Hashimoto,Y. Mitsuyama,T. Onoye |
定期刊行物名 (journal) |
IEEE Transactions on Nuclear Science |
定期刊行物名 (英文) |
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巻数 (volume) |
58 |
号数 (number) |
4 |
ページ範囲 (pages) |
2097--2102 |
刊行月 (month) |
8 |
出版年 (year) |
2011 |
Impact Factor (JCR) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | 159.pdf (application/pdf) [一般閲覧可] |
BiBTeXエントリ |
@article{id302, title = {Neutron-Induced Soft Errors and Multiple Cell Upsets in {65-nm} {10T} Subthreshold {SRAM}}, author = {H. Fuketa and M. Hashimoto and Y. Mitsuyama and T. Onoye}, journal = {IEEE Transactions on Nuclear Science}, volume = {58}, number = {4}, pages = {2097--2102}, month = {8}, year = {2011}, } |