この検索内の頻出タグ: 10t^:2 alpha-particle-induced^:2 cell^:2 errors^:2 multiple^:2 soft^:2 sram^:2 subthreshold^:2 upsets^:2 65-nm^:1 analysis^:1 measurement^:1

2 件の該当がありました． : このページのURL : HTML

論文誌

[1] H. Fuketa, R. Harada, M. Hashimoto, and T. Onoye, "Measurement and Analysis of Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 10T Subthreshold SRAM," IEEE Transactions on Device and Materials Reliability, volume 14, number 1, 463 -- 470, March 2014. [185.pdf]

国際会議

[1] H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, "Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 65-nm 10T Subthreshold SRAM," Proceedings of International Reliability Physics Symposium (IRPS), pages 213--217, May 2010. [140.PDF]