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国際会議

[1] M. Yoshida, R. Iwamoto, M. Itoh, and M. Hashimoto, "Stuck Errors in Bits and Blocks in GDDR6 under High-Energy Neutron Irradiation," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2023.

[2] M. Hashimoto, Y. Zhang, and K. Ito, "Neutron-Induced Stuck Error Bits and Their Recovery in DRAMs on GPU Cards," Proceedings of International Conference on Solid State Devices and Materials (SSDM), September 2022.