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国際会議

[1] R. Iwamoto and M. Hashimoto, "Avoiding Soft Error-Induced Illegal Memory Accesses in GPU with Inter-Thread Communication," Proceedings of International Symposium on On-Line Testing and Robust System Design (IOLTS), July 2023. [pdf]

[2] K. Ito, H. Itsuji, T. Uezono, T. Toba, M. Itoh, and M. Hashimoto, "Constructing Application-Level GPU Error Rate Model with Neutron Irradiation Experiment," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), October 2022.

[3] M. Hashimoto, Y. Zhang, and K. Ito, "Neutron-Induced Stuck Error Bits and Their Recovery in DRAMs on GPU Cards," Proceedings of International Conference on Solid State Devices and Materials (SSDM), September 2022.

[4] H. Itsuji, T. Uezono, T. Toba, K. Ito, and M. Hashimoto, "Concurrent Detection of Failures in GPU Control Logic for Reliable Parallel Computing," Proceedings of International Test Conference (ITC), November 2020. [pdf]

[5] K. Ito, W. Liao, M. Hashimoto, J. Kuroda, S. Manabe, Y. Watanabe, S. Abe, M. Harada, K. Oikawa, and Y. Miyake, "Characterizing Neutron-Induced SDC Rate of Matrix Multiplication in Tesla P4 GPU," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2019.