: T. Nakayama and M. Hashimoto, Stochastic Analysis on Hold Timing Violation in Ultra-Low Temperature Circuits for Functional Test at Room Temperature, July 2019.
Detail of a work
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| T. Nakayama and M. Hashimoto, "Stochastic Analysis on Hold Timing Violation in Ultra-Low Temperature Circuits for Functional Test at Room Temperature," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, 102-A(7), pp. 914--917, July 2019. | |
| ID | 497 |
| 分類 | 論文誌 |
| タグ | analysis circuits functional hold room stochastic temperature test timing ultra-low violation |
| 表題 (title) |
Stochastic Analysis on Hold Timing Violation in Ultra-Low Temperature Circuits for Functional Test at Room Temperature |
| 表題 (英文) |
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| 著者名 (author) |
T. Nakayama,M. Hashimoto |
| 英文著者名 (author) |
T. Nakayama,M. Hashimoto |
| キー (key) |
T. Nakayama,M. Hashimoto |
| 定期刊行物名 (journal) |
IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
102-A |
| 号数 (number) |
7 |
| ページ範囲 (pages) |
914--917 |
| 刊行月 (month) |
7 |
| 出版年 (year) |
2019 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | pdf (application/pdf) [一般閲覧可] |
| BiBTeXエントリ |
@article{id497,
title = {Stochastic Analysis on Hold Timing Violation in Ultra-Low Temperature Circuits for Functional Test at Room Temperature},
author = {T. Nakayama and M. Hashimoto},
journal = {IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences},
volume = {102-A},
number = {7},
pages = {914--917},
month = {7},
year = {2019},
}
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