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論文誌

[1] Z. Huang, A. Kurokawa, M. Hashimoto, T. Sato, M. Jiang, and Y. Inoue, "Modeling the Overshooting Effect for CMOS Inverter Delay Analysis in Nanometer Technologies," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, volume 29, number 2, pages 250--260, February 2010. [134.pdf]

国際会議

[1] U. Schlichtmann, M. Hashimoto, I. H.-R. Jiang, and B. Li, "Reliability, Adaptability and Flexibility in Timing: Buy a Life Insurance for Your Circuits (Invited)," Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pages 705--711, January 2016. [227.pdf]