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論文誌

[1] H. Ochi, K. Yamaguchi, T. Fujimoto, J. Hotate, T. Kishimoto, T. Higashi, T. Imagawa, R. Doi, M. Tada, T. Sugibayashi, W. Takahashi, K. Wakabayashi, H. Onodera, Y. Mitsuyama, J. Yu, and M. Hashimoto, "Via-Switch FPGA: Highly-Dense Mixed-Grained Reconfigurable Architecture with Overlay Via-Switch Crossbars," IEEE Transactions on VLSI Systems, volume 26, number 12, pages 2723--2736, December 2018. [pdf]

[2] T. Kanamoto, Y. Ogasahara, K. Natsume, K. Yamaguchi, H. Amishiro, T. Watanabe, and M. Hashimoto, "Impact of Well Edge Proximity Effect on Timing," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E91-A, number 12, pages 3461-3464, December 2008. [111.pdf]

国際会議

[1] R. Mizuno, M. Niikura, T. Y. Saito, T. Matsuzaki, S. Abe, H. Fukuda, M. Hashimoto, K. Ishida, N. Kawamura, S. Kawase, M. Oishi, P. Strasser, A. Sato, K. Shimomura, S. Takeshita, I. Umegaki, A. Hillier, T. Kawata, K. Kitafuji, Y. Yamaguchi, D. Tomono, and F. Minato, "In-Beam Activation Measurement of Muon Nuclear Capture Reaction on Si Isotopes," The workshop on frontier nuclear studies with gamma-ray spectrometer arrays (gamma24), March 2024.

[2] R. Mizuno, M. Niikura, T. Y. Saito, T. Matsuzaki, S. Abe, H. Fukuda, M. Hashimoto, K. Ishida, N. Kawamura, S. Kawase, M. Oishi, P. Strasser, A. Sato, K. Shimomura, S. Takeshita, I. Umegaki, A. Hillier, T. Kawata, K. Kitafuji, Y. Yamaguchi, D. Tomono, and F. Minato, "Muon Nuclear Capture Reaction on 28,29,30si," 2023 Fall meeting of APS DNP and JPS, November 2023.

[3] M. Niikura, R. Mizuno, S. Manabe, T. Y. Saito, T. Matsuzaki, S. Abe, H. Fukuda, M. Hashimoto, K. Ishida, A. Hillier, N. Kawamura, Y. Kawashima, S. Kawase, T. Kawata, K. Kitafuji, F. Minato, M. Oishi, P. Strasser, A. Sato, K. Shimomura, S. Takeshita, M. Tampo, D. Tomono, I. Umegaki, Y. Yamaguchi, and Y. Watanabe, "Nuclear Physics for Muon-Induced Soft Error," Workshop for Computational Technique for Negative Muon Spectroscopy and Elemental Analysis, August 2023.

[4] T. Kanamoto, Y. Ogasahara, K. Natsume, K. Yamaguchi, H. Amishiro, T. Watanabe, and M. Hashimoto, "Impact of Well Edge Proximity Effect on Timing," Proceedings of 37th European Solid-State Device Research Conference (ESSDERC), pages 115--118, September 2007. [92.pdf]