Detail of a work
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D. Alnajjar, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "PVT-induced Timing Error Detection Through Replica Circuits and Time Redundancy in Reconfigurable Devices," IEICE Electronics Express (ELEX), 10(5), April 2013. | |
ID | 343 |
分類 | 論文誌 |
タグ | circuits detection devices error pvt-induced reconfigurable redundancy replica through time timing |
表題 (title) |
PVT-induced Timing Error Detection Through Replica Circuits and Time Redundancy in Reconfigurable Devices |
表題 (英文) |
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著者名 (author) |
D. Alnajjar,Y. Mitsuyama,M. Hashimoto,T. Onoye |
英文著者名 (author) |
D. Alnajjar,Y. Mitsuyama,M. Hashimoto,T. Onoye |
キー (key) |
D. Alnajjar,Y. Mitsuyama,M. Hashimoto,T. Onoye |
定期刊行物名 (journal) |
IEICE Electronics Express (ELEX) |
定期刊行物名 (英文) |
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巻数 (volume) |
10 |
号数 (number) |
5 |
ページ範囲 (pages) |
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刊行月 (month) |
4 |
出版年 (year) |
2013 |
Impact Factor (JCR) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | 184.pdf (application/pdf) [一般閲覧可] |
BiBTeXエントリ |
@article{id343, title = {{PVT-induced} Timing Error Detection through Replica Circuits and Time Redundancy in Reconfigurable Devices}, author = {D. Alnajjar and Y. Mitsuyama and M. Hashimoto and T. Onoye}, journal = {IEICE Electronics Express (ELEX)}, volume = {10}, number = {5}, month = {4}, year = {2013}, } |