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D. Alnajjar, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "PVT-induced Timing Error Detection Through Replica Circuits and Time Redundancy in Reconfigurable Devices," IEICE Electronics Express (ELEX), 10(5), April 2013.
ID 343
分類 論文誌
タグ circuits detection devices error pvt-induced reconfigurable redundancy replica through time timing
表題 (title) PVT-induced Timing Error Detection Through Replica Circuits and Time Redundancy in Reconfigurable Devices
表題 (英文)
著者名 (author) D. Alnajjar,Y. Mitsuyama,M. Hashimoto,T. Onoye
英文著者名 (author) D. Alnajjar,Y. Mitsuyama,M. Hashimoto,T. Onoye
キー (key) D. Alnajjar,Y. Mitsuyama,M. Hashimoto,T. Onoye
定期刊行物名 (journal) IEICE Electronics Express (ELEX)
定期刊行物名 (英文)
巻数 (volume) 10
号数 (number) 5
ページ範囲 (pages)
刊行月 (month) 4
出版年 (year) 2013
Impact Factor (JCR)
URL
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル 184.pdf (application/pdf) [一般閲覧可]
BiBTeXエントリ
@article{id343,
         title = {{PVT-induced} Timing Error Detection through Replica Circuits and Time Redundancy in Reconfigurable Devices},
        author = {D. Alnajjar and Y. Mitsuyama and M. Hashimoto and T. Onoye},
       journal = {IEICE Electronics Express (ELEX)},
        volume = {10},
        number = {5},
         month = {4},
          year = {2013},
}