Detail of a work
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T. Uemura, T. Kato, R. Tanabe, H. Iwata, H. Matsuyama, M. Hashimoto, K. Takahisa, M. Fukuda, and K. Hatanaka, "Preventing Single Event Latchup with Deep P-Well on P-Substrate," Proceedings of International Reliability Physics Symposium (IRPS), June 2014. | |
ID | 377 |
分類 | 国際会議 |
タグ | |
表題 (title) |
Preventing Single Event Latchup with Deep P-Well on P-Substrate |
表題 (英文) |
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著者名 (author) |
T. Uemura,T. Kato,R. Tanabe,H. Iwata,H. Matsuyama,M. Hashimoto,K. Takahisa,M. Fukuda,K. Hatanaka |
英文著者名 (author) |
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キー (key) |
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定期刊行物名 (journal) |
Proceedings of International Reliability Physics Symposium (IRPS) |
定期刊行物名 (英文) |
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巻数 (volume) |
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号数 (number) |
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ページ範囲 (pages) |
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刊行月 (month) |
6 |
出版年 (year) |
2014 |
Impact Factor (JCR) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | 203.pdf (application/pdf) [一般閲覧可] |
BiBTeXエントリ |
@article{id377, title = {Preventing Single Event Latchup with Deep P-well on P-substrate}, author = {T. Uemura and T. Kato and R. Tanabe and H. Iwata and H. Matsuyama and M. Hashimoto and K. Takahisa and M. Fukuda and K. Hatanaka}, journal = {Proceedings of International Reliability Physics Symposium (IRPS)}, month = {6}, year = {2014}, } |