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H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, "Vth Variation Modeling and Its Validation with Ring Oscillation Frequencies for Body-Biased Circuits and Subthreshold Circuits," Proceedings of Workshop on Test Structure Design for Variability Characterization, November 2008. | |
ID | 222 |
分類 | 国際会議 |
タグ | |
表題 (title) |
Vth Variation Modeling and Its Validation with Ring Oscillation Frequencies for Body-Biased Circuits and Subthreshold Circuits |
表題 (英文) |
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著者名 (author) |
H. Fuketa,M. Hashimoto,Y. Mitsuyama,T. Onoye |
英文著者名 (author) |
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キー (key) |
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定期刊行物名 (journal) |
Proceedings of Workshop on Test Structure Design for Variability Characterization |
定期刊行物名 (英文) |
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巻数 (volume) |
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号数 (number) |
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ページ範囲 (pages) |
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刊行月 (month) |
11 |
出版年 (year) |
2008 |
Impact Factor (JCR) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | 利用できません. |
BiBTeXエントリ |
@article{id222, title = {Vth Variation Modeling and Its Validation with Ring Oscillation Frequencies for Body-biased Circuits and Subthreshold Circuits}, author = {H. Fuketa and M. Hashimoto and Y. Mitsuyama and T. Onoye}, journal = {Proceedings of Workshop on Test Structure Design for Variability Characterization}, month = {11}, year = {2008}, } |