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H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, "Vth Variation Modeling and Its Validation with Ring Oscillation Frequencies for Body-Biased Circuits and Subthreshold Circuits," Proceedings of Workshop on Test Structure Design for Variability Characterization, November 2008.
ID 222
分類 国際会議
タグ
表題 (title) Vth Variation Modeling and Its Validation with Ring Oscillation Frequencies for Body-Biased Circuits and Subthreshold Circuits
表題 (英文)
著者名 (author) H. Fuketa,M. Hashimoto,Y. Mitsuyama,T. Onoye
英文著者名 (author)
キー (key)
定期刊行物名 (journal) Proceedings of Workshop on Test Structure Design for Variability Characterization
定期刊行物名 (英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages)
刊行月 (month) 11
出版年 (year) 2008
Impact Factor (JCR)
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注釈 (annote)
内容梗概 (abstract)
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BiBTeXエントリ
@article{id222,
         title = {Vth Variation Modeling and Its Validation with Ring Oscillation Frequencies for Body-biased Circuits and Subthreshold Circuits},
        author = {H. Fuketa and M. Hashimoto and Y. Mitsuyama and T. Onoye},
       journal = {Proceedings of Workshop on Test Structure Design for Variability Characterization},
         month = {11},
          year = {2008},
}