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H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, "Transistor Variability Modeling and Its Validation with Ring-Oscillation Frequencies for Body-Biased Subthreshold Circuits," IEEE Transactions on VLSI Systems, 18(7), pp. 1118--1129, July 2010. | |
ID | 240 |
分類 | 論文誌 |
タグ | |
表題 (title) |
Transistor Variability Modeling and Its Validation with Ring-Oscillation Frequencies for Body-Biased Subthreshold Circuits |
表題 (英文) |
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著者名 (author) |
H. Fuketa,M. Hashimoto,Y. Mitsuyama,T. Onoye |
英文著者名 (author) |
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キー (key) |
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定期刊行物名 (journal) |
IEEE Transactions on VLSI Systems |
定期刊行物名 (英文) |
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巻数 (volume) |
18 |
号数 (number) |
7 |
ページ範囲 (pages) |
1118--1129 |
刊行月 (month) |
7 |
出版年 (year) |
2010 |
Impact Factor (JCR) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | 130.pdf (application/pdf) [一般閲覧可] |
BiBTeXエントリ |
@article{id240, title = {Transistor Variability Modeling and Its Validation with Ring-oscillation Frequencies for Body-biased Subthreshold Circuits}, author = {H. Fuketa and M. Hashimoto and Y. Mitsuyama and T. Onoye}, journal = {IEEE Transactions on VLSI Systems}, volume = {18}, number = {7}, pages = {1118--1129}, month = {7}, year = {2010}, } |