Detail of a work
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Y. Ogasahara, M. Hashimoto, and T. Onoye, "Measurement and Analysis of Inductive Coupling Noise in 90nm Global Interconnects," IEEE Journal of Solid-State Circuits, 43(3), pp. 718--728, March 2008. | |
ID | 196 |
分類 | 論文誌 |
タグ | |
表題 (title) |
Measurement and Analysis of Inductive Coupling Noise in 90nm Global Interconnects |
表題 (英文) |
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著者名 (author) |
Y. Ogasahara,M. Hashimoto,T. Onoye |
英文著者名 (author) |
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キー (key) |
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定期刊行物名 (journal) |
IEEE Journal of Solid-State Circuits |
定期刊行物名 (英文) |
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巻数 (volume) |
43 |
号数 (number) |
3 |
ページ範囲 (pages) |
718--728 |
刊行月 (month) |
3 |
出版年 (year) |
2008 |
Impact Factor (JCR) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | 99.pdf (application/pdf) [一般閲覧可] |
BiBTeXエントリ |
@article{id196, title = {Measurement and Analysis of Inductive Coupling Noise in 90nm Global Interconnects}, author = {Y. Ogasahara and M. Hashimoto and T. Onoye}, journal = {IEEE Journal of Solid-State Circuits}, volume = {43}, number = {3}, pages = {718--728}, month = {3}, year = {2008}, } |