: K. Shinkai, M. Hashimoto, A. Kurokawa, and T. Onoye, A Gate Delay Model Focusing on Current Fluctuation Over Wide-Range of Process and Environmental Variability, November 2006.
Detail of a work
| Tweet | |
| K. Shinkai, M. Hashimoto, A. Kurokawa, and T. Onoye, "A Gate Delay Model Focusing on Current Fluctuation Over Wide-Range of Process and Environmental Variability," In Proceedings of ACM/IEEE International Conference on Computer-Aided Design (ICCAD), pp. 47-53, November 2006. | |
| ID | 30 |
| 分類 | 国際会議 |
| タグ | |
| 表題 (title) |
A Gate Delay Model Focusing on Current Fluctuation Over Wide-Range of Process and Environmental Variability |
| 表題 (英文) |
|
| 著者名 (author) |
K. Shinkai,M. Hashimoto,A. Kurokawa,T. Onoye |
| 英文著者名 (author) |
|
| 編者名 (editor) |
|
| 編者名 (英文) |
|
| キー (key) |
|
| 書籍・会議録表題 (booktitle) |
Proceedings of ACM/IEEE International Conference on Computer-Aided Design (ICCAD) |
| 書籍・会議録表題(英文) |
|
| 巻数 (volume) |
|
| 号数 (number) |
|
| ページ範囲 (pages) |
47-53 |
| 組織名 (organization) |
|
| 出版元 (publisher) |
|
| 出版元 (英文) |
|
| 出版社住所 (address) |
|
| 刊行月 (month) |
11 |
| 出版年 (year) |
2006 |
| 採択率 (acceptance) |
|
| URL |
|
| 付加情報 (note) |
|
| 注釈 (annote) |
|
| 内容梗概 (abstract) |
|
| 論文電子ファイル | 22.pdf (application/pdf) [一般閲覧可] |
| BiBTeXエントリ |
@inproceedings{id30,
title = {A Gate Delay Model Focusing on Current Fluctuation over Wide-Range of Process and Environmental Variability},
author = {K. Shinkai and M. Hashimoto and A. Kurokawa and T. Onoye},
booktitle = {Proceedings of ACM/IEEE International Conference on Computer-Aided Design (ICCAD)},
pages = {47-53},
month = {11},
year = {2006},
}
|