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論文誌

[1] X. Bai, N. Banno, M. Miyamura, R. Nebashi, K. Okamoto, H. Numata, N. Iguchi, M. Hashimoto, T. Sugibayashi, T. Sakamoto, and M. Tada, "Via-Switch FPGA: 65nm CMOS Implementation and Evaluation," IEEE Journal of Solid-State Circuits, volume 57, number 7, pages 2250-2262, July 2022. [pdf]

[2] N. Banno, K. Okamoto, N. Iguchi, H. Ochi, H. Onodera, M. Hashimoto, T. Sugibayashi, T. Sakamoto, and M. Tada, "Low-Power Crossbar Switch with Two-Varistors Selected Complementary Atom Switch (2V-1CAS; Via-Switch) for Nonvolatile FPGA," IEEE Transactions on Electron Devices, volume 66, number 8, pages 3331--3336, August 2019. [pdf]

[3] T. Kanamoto, T. Okumura, K. Furukawa, H. Takafuji, A. Kurokawa, K. Hachiya, T. Sakata, M. Tanaka, H. Nakashima, H. Masuda, T. Sato, and M. Hashimoto, "Impact of Self-Heating in Wire Interconnection on Timing," IEICE Trans. on Electronics, volume E93-C, number 3, pages 388--392, March 2010. [136.pdf]

[4] T. Sakata, T. Okumura, A. Kurokawa, H. Nakashima, H. Masuda, T. Sato, M. Hashimoto, K. Hachiya, K. Furukawa, M. Tanaka, H. Takafuji, and T. Kanamoto, "An Approach for Reducing Leakage Current Variation Due to Manufacturing Variability," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E92-A, number 12, pages 3016--3023, December 2009. [129.pdf]

[5] T. Okumura, A. Kurokawa, H. Masuda, T. Kanamoto, M. Hashimoto, H. Takafuji, H. Nakashima, N. Ono, T. Sakata, and T. Sato, "Improvement in Computational Accuracy of Output Transition Time Variation Considering Threshold Voltage Variations," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume 92-A, number 4, pages 990--997, April 2009. [119.pdf]

[6] T. Kanamoto, S. Akutsu, T. Nakabayashi, T. Ichinomiya, K. Hachiya, A. Kurokawa, H. Ishikawa, S. Muromoto, H. Kobayashi, and M. Hashimoto, "Impact of Intrinsic Parasitic Extraction Errors on Timing and Noise Estimation," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E89-A, number 12, pages 3666-3670, December 2006. [5.pdf]

[7] A. Kurokawa, M. Hashimoto, A. Kasebe, Z.-C. Huang, Y. Yang, Y. Inoue, R. Inagaki, and H. Masuda, "Second-Order Polynomial Expressions for On-Chip Interconnect Capacitance," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E88-A, number 12, pages 3453-3462, December 2005. [10.pdf]

[8] 金本俊幾, 佐藤高史, 黒川敦, 川上善之, 岡宏規, 北浦智靖, 小林宏行, 橋本昌宜, "遅延計算におけるインダクタンスを考慮すべき配線の統計的選別手法," 情報処理学会論文誌, volume 44, number 5, pages 1301-1310, 2003年5月. [21.pdf]

国際会議

[1] X. Bai, N. Banno, M. Miyamura, R. Nebashi, K. Okamoto, H. Numata, N. Iguchi, M. Hashimoto, T. Sugibayashi, T. Sakamoto, and M. Tada, "1.5x Energy-Efficient and 1.4x Operation-Speed Via-Switch FPGA with Rapid and Low-Cost ASIC Migration by Via-Switch Copy," Technical Digest of VLSI Symposium on Technology, June 2020. [pdf]

[2] H. Numata, N. Banno, K. Okamoto, N. Iguchi, H. Hada, M. Hashimoto, T. Sugibayashi, T. Sakamoto, and M. Tada, "Characterization of Chalcogenide Selectors for Crossbar Switch Used in Nonvolatile FPGA," Proceedings of Silicon Nanoelectronics Workshop, June 2019. [pdf]

[3] N. Banno, M. Tada, K. Okamoto, N. Iguchi, T. Sakamoto, H. Hada, H. Ochi, H. Onodera, M. Hashimoto, and T. Sugibayashi, "50x20 Crossbar Switch Block (CSB) with Two-Varistors (a-Si/SiN/a-Si) Selected Complementary Atom Switch for a Highly-Dense Reconfigurable Logic," Technical Digest of IEEE International Electron Devices Meeting (IEDM), December 2016. [231.PDF]

[4] N. Banno, M.Tada, K. Okamoto, N. Iguchi, T. Sakamoto, M. Miyamura, Y. Tsuji, H. Hada, H. Ochi, H. Onodera, M. Hashimoto, and T. Sugibayashi, "A Novel Two-Varistors (a-Si/SiN/a-Si) Selected Complementary Atom Switch (2V-1CAS) for Nonvolatile Crossbar Switch with Multiple Fan-Outs," Technical Digest of IEEE International Electron Devices Meeting (IEDM), pages 32--35, December 2015. [225.PDF]

[5] T. Uemura, T. Kato, S. Okano, H. Matsuyama, and M. Hashimoto, "Impact of Package on Neutron Induced Single Event Upset in 20 nm SRAM," Proceedings of International Symposium on Reliability Physics (IRPS), April 2015. [215.pdf]

[6] T. Uemura, S. Okano, T. Kato, H. Matsuyama, and M. Hashimoto, "Soft Error Immune Latch Design for 20 nm Bulk CMOS," Proceedings of International Reliability Physics Symposium (IRPS), April 2015. [217.pdf]

[7] T. Sato, T. Kanamoto, A. Kurokawa, Y. Kawakami, H. Oka, T. Kitaura, H. Kobayashi, and M. Hashimoto, "Accurate Prediction of the Impact of On-Chip Inductance on Interconnect Delay Using Electrical and Physical Parameters," In Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pages 149-155, January 2003. [40.pdf]

国内会議(査読付き)

[1] 金本俊幾, 阿久津滋聖, 中林太美世, 一宮敬弘, 蜂屋孝太郎, 石川博, 室本栄, 小林宏行, 橋本昌宜, 黒川敦, "遅延計算およびシグナルインテグリティを考慮した配線寄生容量抽出精度評価," 情報処理学会DAシンポジウム, pages 265-270, 2004年7月.

[2] 金本俊幾, 佐藤高史, 黒川敦, 川上善之, 岡宏規, 北浦智靖, 池内敦彦, 小林宏行, 橋本昌宜, "0.1μm級LSIの遅延計算における寄生インダクタンスを考慮すべき配線の統計的選別手法," 情報処理学会DAシンポジウム, pages 149-154, 2002年7月.

[3] 佐藤高史, 金本俊幾, 黒川敦, 川上善之, 岡宏規, 北浦智靖, 池内敦彦, 小林宏行, 橋本昌宜, "インダクタンスが配線遅延に及ぼす影響の定量的評価方法," 第15回 回路とシステム(軽井沢)ワークショップ, pages 493-498, 2002年4月.

研究会・全国大会等

[1] 佐藤高史, 金本俊幾, 黒川敦, 川上善之, 岡宏規, 北浦智靖, 池内敦彦, 小林宏行, 橋本昌宜, "インダクタンスに起因する配線遅延変動の統計的予測手法," 2002年電子情報通信学会ソサイエティ大会講演論文集, number TA-2-4, pages 247-248, 2002年9月.