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T. Sakata, T. Okumura, A. Kurokawa, H. Nakashima, H. Masuda, T. Sato, M. Hashimoto, K. Hachiya, K. Furukawa, M. Tanaka, H. Takafuji, and T. Kanamoto, "An Approach for Reducing Leakage Current Variation Due to Manufacturing Variability," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, E92-A(12), pp. 3016--3023, December 2009. | |
ID | 251 |
分類 | 論文誌 |
タグ | |
表題 (title) |
An Approach for Reducing Leakage Current Variation Due to Manufacturing Variability |
表題 (英文) |
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著者名 (author) |
T. Sakata,T. Okumura,A. Kurokawa,H. Nakashima,H. Masuda,T. Sato,M. Hashimoto,K. Hachiya,K. Furukawa,M. Tanaka,H. Takafuji,T. Kanamoto |
英文著者名 (author) |
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キー (key) |
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定期刊行物名 (journal) |
IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences |
定期刊行物名 (英文) |
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巻数 (volume) |
E92-A |
号数 (number) |
12 |
ページ範囲 (pages) |
3016--3023 |
刊行月 (month) |
12 |
出版年 (year) |
2009 |
Impact Factor (JCR) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | 129.pdf (application/pdf) [一般閲覧可] |
BiBTeXエントリ |
@article{id251, title = {An Approach for Reducing Leakage Current Variation due to Manufacturing Variability}, author = {T. Sakata and T. Okumura and A. Kurokawa and H. Nakashima and H. Masuda and T. Sato and M. Hashimoto and K. Hachiya and K. Furukawa and M. Tanaka and H. Takafuji and T. Kanamoto}, journal = {IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences}, volume = {E92-A}, number = {12}, pages = {3016--3023}, month = {12}, year = {2009}, } |