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Y. Masuda, J. Nagayama, T. Cheng, T. Ishihara, Y. Momiyama, , and M. Hashimoto, "Low-Power Design Methodology of Voltage Over-Scalable Circuit with Critical Path Isolation and Bit-Width Scaling," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, 105-A(3), pp. 509--517, March 2022.
ID 576
分類 論文誌
タグ bit-width circuit critical design isolation low-power methodology over-scalable path scaling voltage
表題 (title) Low-Power Design Methodology of Voltage Over-Scalable Circuit with Critical Path Isolation and Bit-Width Scaling
表題 (英文)
著者名 (author) Y. Masuda, J. Nagayama, T. Cheng, T. Ishihara, Y. Momiyama,,M. Hashimoto
英文著者名 (author) ,M. Hashimoto
キー (key) ,M. Hashimoto
定期刊行物名 (journal) IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences
定期刊行物名 (英文)
巻数 (volume) 105-A
号数 (number) 3
ページ範囲 (pages) 509--517
刊行月 (month) 3
出版年 (year) 2022
Impact Factor (JCR)
URL
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル pdf (application/pdf) [一般閲覧可]
BiBTeXエントリ
@article{id576,
         title = {Low-Power Design Methodology of Voltage Over-Scalable Circuit with Critical Path Isolation and Bit-Width Scaling},
        author = {Y. Masuda and  J. Nagayama and  T. Cheng and  T. Ishihara and  Y. Momiyama and  and M. Hashimoto},
       journal = {IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences},
        volume = {105-A},
        number = {3},
         pages = {509--517},
         month = {3},
          year = {2022},
}