Detail of a work
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| Y. Masuda, J. Nagayama, T. Cheng, T. Ishihara, Y. Momiyama, , and M. Hashimoto, "Low-Power Design Methodology of Voltage Over-Scalable Circuit with Critical Path Isolation and Bit-Width Scaling," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, 105-A(3), pp. 509--517, March 2022. | |
| ID | 576 |
| 分類 | 論文誌 |
| タグ | bit-width circuit critical design isolation low-power methodology over-scalable path scaling voltage |
| 表題 (title) |
Low-Power Design Methodology of Voltage Over-Scalable Circuit with Critical Path Isolation and Bit-Width Scaling |
| 表題 (英文) |
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| 著者名 (author) |
Y. Masuda, J. Nagayama, T. Cheng, T. Ishihara, Y. Momiyama,,M. Hashimoto |
| 英文著者名 (author) |
,M. Hashimoto |
| キー (key) |
,M. Hashimoto |
| 定期刊行物名 (journal) |
IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
105-A |
| 号数 (number) |
3 |
| ページ範囲 (pages) |
509--517 |
| 刊行月 (month) |
3 |
| 出版年 (year) |
2022 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | pdf (application/pdf) [一般閲覧可] |
| BiBTeXエントリ |
@article{id576,
title = {Low-Power Design Methodology of Voltage Over-Scalable Circuit with Critical Path Isolation and Bit-Width Scaling},
author = {Y. Masuda and J. Nagayama and T. Cheng and T. Ishihara and Y. Momiyama and and M. Hashimoto},
journal = {IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences},
volume = {105-A},
number = {3},
pages = {509--517},
month = {3},
year = {2022},
}
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