Detail of a work
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H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, "Correlation Verification between Transistor Variability Model with Body Biasing and Ring Oscillation Frequency in 90nm Subthreshold Circuits," Proceedings of IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED), pp. 3--8, August 2008. | |
ID | 210 |
分類 | 国際会議 |
タグ | |
表題 (title) |
Correlation Verification between Transistor Variability Model with Body Biasing and Ring Oscillation Frequency in 90nm Subthreshold Circuits |
表題 (英文) |
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著者名 (author) |
H. Fuketa,M. Hashimoto,Y. Mitsuyama,T. Onoye |
英文著者名 (author) |
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キー (key) |
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定期刊行物名 (journal) |
Proceedings of IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED) |
定期刊行物名 (英文) |
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巻数 (volume) |
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号数 (number) |
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ページ範囲 (pages) |
3--8 |
刊行月 (month) |
8 |
出版年 (year) |
2008 |
Impact Factor (JCR) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | 106.pdf (application/pdf) [一般閲覧可] |
BiBTeXエントリ |
@article{id210, title = {Correlation verification between transistor variability model with body biasing and ring oscillation frequency in 90nm subthreshold circuits}, author = {H. Fuketa and M. Hashimoto and Y. Mitsuyama and T. Onoye}, journal = {Proceedings of IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED)}, pages = {3--8}, month = {8}, year = {2008}, } |