: H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, Correlation Verification between Transistor Variability Model with Body Biasing and Ring Oscillation Frequency in 90nm Subthreshold Circuits, August 2008.
Detail of a work
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| H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, "Correlation Verification between Transistor Variability Model with Body Biasing and Ring Oscillation Frequency in 90nm Subthreshold Circuits," Proceedings of IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED), pp. 3--8, August 2008. | |
| ID | 210 |
| 分類 | 国際会議 |
| タグ | |
| 表題 (title) |
Correlation Verification between Transistor Variability Model with Body Biasing and Ring Oscillation Frequency in 90nm Subthreshold Circuits |
| 表題 (英文) |
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| 著者名 (author) |
H. Fuketa,M. Hashimoto,Y. Mitsuyama,T. Onoye |
| 英文著者名 (author) |
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| キー (key) |
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| 定期刊行物名 (journal) |
Proceedings of IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED) |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
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| 号数 (number) |
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| ページ範囲 (pages) |
3--8 |
| 刊行月 (month) |
8 |
| 出版年 (year) |
2008 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | 106.pdf (application/pdf) [一般閲覧可] |
| BiBTeXエントリ |
@article{id210,
title = {Correlation verification between transistor variability model with body biasing and ring oscillation frequency in 90nm subthreshold circuits},
author = {H. Fuketa and M. Hashimoto and Y. Mitsuyama and T. Onoye},
journal = {Proceedings of IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED)},
pages = {3--8},
month = {8},
year = {2008},
}
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