Detail of a work
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Y. Higuchi, K. Shinkai, M. Hashimoto, R. Rao, and S. Nassif, "Extracting Device-Parameter Variations Using a Single Sensitivity-Configurable Ring Oscillator," Proceedings of IEEE European Test Symposium (ETS), pp. 106--111, May 2013. | |
ID | 344 |
分類 | 国際会議 |
タグ | |
表題 (title) |
Extracting Device-Parameter Variations Using a Single Sensitivity-Configurable Ring Oscillator |
表題 (英文) |
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著者名 (author) |
Y. Higuchi,K. Shinkai,M. Hashimoto,R. Rao,S. Nassif |
英文著者名 (author) |
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キー (key) |
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定期刊行物名 (journal) |
Proceedings of IEEE European Test Symposium (ETS) |
定期刊行物名 (英文) |
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巻数 (volume) |
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号数 (number) |
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ページ範囲 (pages) |
106--111 |
刊行月 (month) |
5 |
出版年 (year) |
2013 |
Impact Factor (JCR) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | 186.pdf (application/pdf) [一般閲覧可] |
BiBTeXエントリ |
@article{id344, title = {Extracting Device-Parameter Variations using a Single Sensitivity-Configurable Ring Oscillator}, author = {Y. Higuchi and K. Shinkai and M. Hashimoto and R. Rao and S. Nassif}, journal = {Proceedings of IEEE European Test Symposium (ETS)}, pages = {106--111}, month = {5}, year = {2013}, } |