: Y. Higuchi, K. Shinkai, M. Hashimoto, R. Rao, and S. Nassif, Extracting Device-Parameter Variations Using a Single Sensitivity-Configurable Ring Oscillator, May 2013.
Detail of a work
| Tweet | |
| Y. Higuchi, K. Shinkai, M. Hashimoto, R. Rao, and S. Nassif, "Extracting Device-Parameter Variations Using a Single Sensitivity-Configurable Ring Oscillator," Proceedings of IEEE European Test Symposium (ETS), pp. 106--111, May 2013. | |
| ID | 344 |
| 分類 | 国際会議 |
| タグ | |
| 表題 (title) |
Extracting Device-Parameter Variations Using a Single Sensitivity-Configurable Ring Oscillator |
| 表題 (英文) |
|
| 著者名 (author) |
Y. Higuchi,K. Shinkai,M. Hashimoto,R. Rao,S. Nassif |
| 英文著者名 (author) |
|
| キー (key) |
|
| 定期刊行物名 (journal) |
Proceedings of IEEE European Test Symposium (ETS) |
| 定期刊行物名 (英文) |
|
| 巻数 (volume) |
|
| 号数 (number) |
|
| ページ範囲 (pages) |
106--111 |
| 刊行月 (month) |
5 |
| 出版年 (year) |
2013 |
| Impact Factor (JCR) |
|
| URL |
|
| 付加情報 (note) |
|
| 注釈 (annote) |
|
| 内容梗概 (abstract) |
|
| 論文電子ファイル | 186.pdf (application/pdf) [一般閲覧可] |
| BiBTeXエントリ |
@article{id344,
title = {Extracting Device-Parameter Variations using a Single Sensitivity-Configurable Ring Oscillator},
author = {Y. Higuchi and K. Shinkai and M. Hashimoto and R. Rao and S. Nassif},
journal = {Proceedings of IEEE European Test Symposium (ETS)},
pages = {106--111},
month = {5},
year = {2013},
}
|