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D. Alnajjar, Y. Ko, T. Imagawa, M. Hiromoto, Y. Mitsuyama, M. Hashimoto, H. Ochi, and T. Onoye, "A Coarse-Grained Dynamically Reconfigurable Architecture Enabling Flexible Reliability," Proceedings of IEEE Workshop on System Effects of Logic Soft Errors (SELSE), March 2009.
ID 237
分類 国際会議
タグ
表題 (title) A Coarse-Grained Dynamically Reconfigurable Architecture Enabling Flexible Reliability
表題 (英文)
著者名 (author) D. Alnajjar,Y. Ko,T. Imagawa,M. Hiromoto,Y. Mitsuyama,M. Hashimoto,H. Ochi,T. Onoye
英文著者名 (author)
キー (key)
定期刊行物名 (journal) Proceedings of IEEE Workshop on System Effects of Logic Soft Errors (SELSE)
定期刊行物名 (英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages)
刊行月 (month) 3
出版年 (year) 2009
Impact Factor (JCR)
URL
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
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BiBTeXエントリ
@article{id237,
         title = {A Coarse-Grained Dynamically Reconfigurable Architecture Enabling Flexible Reliability},
        author = {D. Alnajjar and Y. Ko and T. Imagawa and M. Hiromoto and Y. Mitsuyama and M. Hashimoto and H. Ochi and T. Onoye},
       journal = {Proceedings of IEEE Workshop on System Effects of Logic Soft Errors (SELSE)},
         month = {3},
          year = {2009},
}