Detail of a work
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M. Ueno, M. Hashimoto, and T. Onoye, "Real-Time On-Chip Supply Voltage Sensor and Its Application to Trace-Based Timing Error Localization," Proceedings of International On-Line Testing Symposium (IOLTS), pp. 188--193, July 2015. | |
ID | 416 |
分類 | 国際会議 |
タグ | |
表題 (title) |
Real-Time On-Chip Supply Voltage Sensor and Its Application to Trace-Based Timing Error Localization |
表題 (英文) |
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著者名 (author) |
M. Ueno,M. Hashimoto,T. Onoye |
英文著者名 (author) |
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キー (key) |
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定期刊行物名 (journal) |
Proceedings of International On-Line Testing Symposium (IOLTS) |
定期刊行物名 (英文) |
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巻数 (volume) |
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号数 (number) |
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ページ範囲 (pages) |
188--193 |
刊行月 (month) |
7 |
出版年 (year) |
2015 |
Impact Factor (JCR) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | 222.pdf (application/pdf) [一般閲覧可] |
BiBTeXエントリ |
@article{id416, title = {Real-time On-chip Supply Voltage Sensor and Its Application to Trace-based Timing Error Localization}, author = {M. Ueno and M. Hashimoto and T. Onoye}, journal = {Proceedings of International On-Line Testing Symposium (IOLTS)}, pages = {188--193}, month = {7}, year = {2015}, } |