Detail of a work
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| Y. Ogasahara, M. Hashimoto, T. Kanamoto, and T. Onoye, "Measurement of Supply Noise Suppression by Substrate and Deep N-Well in 90nm Process," Proceedings of IEEE Asian Solid-State Circuits Conference (A-SSCC), pp. 397--400, November 2008. | |
| ID | 217 |
| 分類 | 国際会議 |
| タグ | |
| 表題 (title) |
Measurement of Supply Noise Suppression by Substrate and Deep N-Well in 90nm Process |
| 表題 (英文) |
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| 著者名 (author) |
Y. Ogasahara,M. Hashimoto,T. Kanamoto,T. Onoye |
| 英文著者名 (author) |
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| キー (key) |
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| 定期刊行物名 (journal) |
Proceedings of IEEE Asian Solid-State Circuits Conference (A-SSCC) |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
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| 号数 (number) |
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| ページ範囲 (pages) |
397--400 |
| 刊行月 (month) |
11 |
| 出版年 (year) |
2008 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | 109.pdf (application/pdf) [一般閲覧可] |
| BiBTeXエントリ |
@article{id217,
title = {Measurement of Supply Noise Suppression by Substrate and Deep N-well in 90nm Process},
author = {Y. Ogasahara and M. Hashimoto and T. Kanamoto and T. Onoye},
journal = {Proceedings of IEEE Asian Solid-State Circuits Conference (A-SSCC)},
pages = {397--400},
month = {11},
year = {2008},
}
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