Detail of a work
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Y. Ogasahara, M. Hashimoto, T. Kanamoto, and T. Onoye, "Measurement of Supply Noise Suppression by Substrate and Deep N-Well in 90nm Process," Proceedings of IEEE Asian Solid-State Circuits Conference (A-SSCC), pp. 397--400, November 2008. | |
ID | 217 |
分類 | 国際会議 |
タグ | |
表題 (title) |
Measurement of Supply Noise Suppression by Substrate and Deep N-Well in 90nm Process |
表題 (英文) |
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著者名 (author) |
Y. Ogasahara,M. Hashimoto,T. Kanamoto,T. Onoye |
英文著者名 (author) |
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キー (key) |
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定期刊行物名 (journal) |
Proceedings of IEEE Asian Solid-State Circuits Conference (A-SSCC) |
定期刊行物名 (英文) |
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巻数 (volume) |
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号数 (number) |
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ページ範囲 (pages) |
397--400 |
刊行月 (month) |
11 |
出版年 (year) |
2008 |
Impact Factor (JCR) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | 109.pdf (application/pdf) [一般閲覧可] |
BiBTeXエントリ |
@article{id217, title = {Measurement of Supply Noise Suppression by Substrate and Deep N-well in 90nm Process}, author = {Y. Ogasahara and M. Hashimoto and T. Kanamoto and T. Onoye}, journal = {Proceedings of IEEE Asian Solid-State Circuits Conference (A-SSCC)}, pages = {397--400}, month = {11}, year = {2008}, } |