Detail of a work
Tweet | |
Y. Masuda, J. Nagayama, T. Cheng, T. Ishihara, Y. Momiyama, and M. Hashimoto, "Critical Path Isolation and Bit-Width Scaling Are Highly Compatible for Voltage Over-Scalable Design," Proceedings of Design, Automation and Test in Europe Conference (DATE), February 2021. | |
ID | 560 |
分類 | 国際会議 |
タグ | are bit-width compatible critical design highly isolation over-scalable path scaling voltage |
表題 (title) |
Critical Path Isolation and Bit-Width Scaling Are Highly Compatible for Voltage Over-Scalable Design |
表題 (英文) |
|
著者名 (author) |
Y. Masuda,J. Nagayama,T. Cheng,T. Ishihara,Y. Momiyama,M. Hashimoto |
英文著者名 (author) |
Y. Masuda,,,,,M. Hashimoto |
キー (key) |
Y. Masuda,,,,,M. Hashimoto |
定期刊行物名 (journal) |
Proceedings of Design, Automation and Test in Europe Conference (DATE) |
定期刊行物名 (英文) |
|
巻数 (volume) |
|
号数 (number) |
|
ページ範囲 (pages) |
|
刊行月 (month) |
2 |
出版年 (year) |
2021 |
Impact Factor (JCR) |
|
URL |
|
付加情報 (note) |
|
注釈 (annote) |
|
内容梗概 (abstract) |
|
論文電子ファイル | pdf (application/pdf) [一般閲覧可] |
BiBTeXエントリ |
@article{id560, title = {Critical Path Isolation and Bit-Width Scaling Are Highly Compatible for Voltage Over-Scalable Design}, author = {Y. Masuda and J. Nagayama and T. Cheng and T. Ishihara and Y. Momiyama and M. Hashimoto}, journal = {Proceedings of Design, Automation and Test in Europe Conference (DATE)}, month = {2}, year = {2021}, } |