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Y. Masuda, J. Nagayama, H. Takeno, Y. Ogawa, Y. Momiyama, and M. Hashimoto, "Comparing Voltage Adaptation Performance between Replica and In-Situ Timing Monitors," Proceedings of ACM/IEEE International Conference on Computer-Aided Design (ICCAD), November 2018.
ID 486
分類 国際会議
タグ adaptation comparing in-situ monitors performance replica timing voltage
表題 (title) Comparing Voltage Adaptation Performance between Replica and In-Situ Timing Monitors
表題 (英文)
著者名 (author) Y. Masuda,J. Nagayama,H. Takeno,Y. Ogawa,Y. Momiyama,M. Hashimoto
英文著者名 (author) ,,,,,
キー (key) ,,,,,
定期刊行物名 (journal) Proceedings of ACM/IEEE International Conference on Computer-Aided Design (ICCAD)
定期刊行物名 (英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages)
刊行月 (month) 11
出版年 (year) 2018
Impact Factor (JCR)
URL
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル pdf (application/pdf) [一般閲覧可]
BiBTeXエントリ
@article{id486,
         title = {Comparing Voltage Adaptation Performance between Replica and In-Situ Timing Monitors},
        author = {Y. Masuda and J. Nagayama and H. Takeno and Y. Ogawa and Y. Momiyama and M. Hashimoto},
       journal = {Proceedings of ACM/IEEE International Conference on Computer-Aided Design (ICCAD)},
         month = {11},
          year = {2018},
}