: Y. Ogasahara, T. Enami, M. Hashimoto, T. Sato, and T. Onoye, Measurement Results of Delay Degradation Due to Power Supply Noise Well Correlated with Full-Chip Simulation, September 2006.
Detail of a work
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| Y. Ogasahara, T. Enami, M. Hashimoto, T. Sato, and T. Onoye, "Measurement Results of Delay Degradation Due to Power Supply Noise Well Correlated with Full-Chip Simulation," In Proceedings of IEEE Custom Integrated Circuits Conference (CICC),, pp. 861-864, September 2006. | |
| ID | 33 |
| 分類 | 国際会議 |
| タグ | |
| 表題 (title) |
Measurement Results of Delay Degradation Due to Power Supply Noise Well Correlated with Full-Chip Simulation |
| 表題 (英文) |
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| 著者名 (author) |
Y. Ogasahara,T. Enami,M. Hashimoto,T. Sato,T. Onoye |
| 英文著者名 (author) |
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| 編者名 (editor) |
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| 編者名 (英文) |
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| キー (key) |
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| 書籍・会議録表題 (booktitle) |
Proceedings of IEEE Custom Integrated Circuits Conference (CICC), |
| 書籍・会議録表題(英文) |
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| 巻数 (volume) |
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| 号数 (number) |
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| ページ範囲 (pages) |
861-864 |
| 組織名 (organization) |
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| 出版元 (publisher) |
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| 出版元 (英文) |
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| 出版社住所 (address) |
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| 刊行月 (month) |
9 |
| 出版年 (year) |
2006 |
| 採択率 (acceptance) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | 25.pdf (application/pdf) [一般閲覧可] |
| BiBTeXエントリ |
@inproceedings{id33,
title = {Measurement results of delay degradation due to power supply noise well correlated with full-chip simulation},
author = {Y. Ogasahara and T. Enami and M. Hashimoto and T. Sato and T. Onoye},
booktitle = {Proceedings of IEEE Custom Integrated Circuits Conference (CICC),},
pages = {861-864},
month = {9},
year = {2006},
}
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