: Y. Masuda, M. Hashimoto, and T. Onoye, Critical Path Isolation for Time-To-Failure Extension and Lower Voltage Operation, November 2016.
Detail of a work
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| Y. Masuda, M. Hashimoto, and T. Onoye, "Critical Path Isolation for Time-To-Failure Extension and Lower Voltage Operation," Proceedings of International Conference on Computer-Aided Design (ICCAD), November 2016. | |
| ID | 434 |
| 分類 | 国際会議 |
| タグ | |
| 表題 (title) |
Critical Path Isolation for Time-To-Failure Extension and Lower Voltage Operation |
| 表題 (英文) |
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| 著者名 (author) |
Y. Masuda,M. Hashimoto,T. Onoye |
| 英文著者名 (author) |
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| キー (key) |
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| 定期刊行物名 (journal) |
Proceedings of International Conference on Computer-Aided Design (ICCAD) |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
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| 号数 (number) |
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| ページ範囲 (pages) |
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| 刊行月 (month) |
11 |
| 出版年 (year) |
2016 |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | 230.pdf (application/pdf) [一般閲覧可] |
| BiBTeXエントリ |
@article{id434,
title = {Critical Path Isolation for Time-to-Failure Extension and Lower Voltage Operation},
author = {Y. Masuda and M. Hashimoto and T. Onoye},
journal = {Proceedings of International Conference on Computer-Aided Design (ICCAD)},
month = {11},
year = {2016},
}
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