Detail of a work
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Y. Masuda, M. Hashimoto, and T. Onoye, "Critical Path Isolation for Time-To-Failure Extension and Lower Voltage Operation," Proceedings of International Conference on Computer-Aided Design (ICCAD), November 2016. | |
ID | 434 |
分類 | 国際会議 |
タグ | |
表題 (title) |
Critical Path Isolation for Time-To-Failure Extension and Lower Voltage Operation |
表題 (英文) |
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著者名 (author) |
Y. Masuda,M. Hashimoto,T. Onoye |
英文著者名 (author) |
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キー (key) |
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定期刊行物名 (journal) |
Proceedings of International Conference on Computer-Aided Design (ICCAD) |
定期刊行物名 (英文) |
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巻数 (volume) |
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号数 (number) |
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ページ範囲 (pages) |
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刊行月 (month) |
11 |
出版年 (year) |
2016 |
Impact Factor (JCR) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | 230.pdf (application/pdf) [一般閲覧可] |
BiBTeXエントリ |
@article{id434, title = {Critical Path Isolation for Time-to-Failure Extension and Lower Voltage Operation}, author = {Y. Masuda and M. Hashimoto and T. Onoye}, journal = {Proceedings of International Conference on Computer-Aided Design (ICCAD)}, month = {11}, year = {2016}, } |