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K. Shinkai, M. Hashimoto, A. Kurokawa, and T. Onoye, "A Gate Delay Model Focusing on Current Fluctuation Over Wide-Range of Process Variations," In ACM/IEEE International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), pp. 59-64, February 2006. | |
ID | 36 |
分類 | 国際会議 |
タグ | |
表題 (title) |
A Gate Delay Model Focusing on Current Fluctuation Over Wide-Range of Process Variations |
表題 (英文) |
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著者名 (author) |
K. Shinkai,M. Hashimoto,A. Kurokawa,T. Onoye |
英文著者名 (author) |
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編者名 (editor) |
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編者名 (英文) |
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キー (key) |
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書籍・会議録表題 (booktitle) |
ACM/IEEE International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU) |
書籍・会議録表題(英文) |
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巻数 (volume) |
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号数 (number) |
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ページ範囲 (pages) |
59-64 |
組織名 (organization) |
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出版元 (publisher) |
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出版元 (英文) |
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出版社住所 (address) |
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刊行月 (month) |
2 |
出版年 (year) |
2006 |
採択率 (acceptance) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | 利用できません. |
BiBTeXエントリ |
@inproceedings{id36, title = {A Gate Delay Model Focusing on Current Fluctuation over Wide-Range of Process Variations}, author = {K. Shinkai and M. Hashimoto and A. Kurokawa and T. Onoye}, booktitle = {ACM/IEEE International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU)}, pages = {59-64}, month = {2}, year = {2006}, } |