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M. Hashimoto, "Toward Robust Subthreshold Circuit Design: Variability and Soft Error Perspective (Invited)," Proceedings of SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), October 2014. | |
ID | 385 |
分類 | 国際会議 |
タグ | |
表題 (title) |
Toward Robust Subthreshold Circuit Design: Variability and Soft Error Perspective (Invited) |
表題 (英文) |
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著者名 (author) |
M. Hashimoto |
英文著者名 (author) |
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キー (key) |
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定期刊行物名 (journal) |
Proceedings of SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) |
定期刊行物名 (英文) |
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巻数 (volume) |
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号数 (number) |
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ページ範囲 (pages) |
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刊行月 (month) |
10 |
出版年 (year) |
2014 |
Impact Factor (JCR) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | 205.pdf (application/pdf) [一般閲覧可] |
BiBTeXエントリ |
@article{id385, title = {Toward Robust Subthreshold Circuit Design: Variability and Soft Error Perspective (Invited)}, author = {M. Hashimoto}, journal = {Proceedings of SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)}, month = {10}, year = {2014}, } |