: R. Doi, M. Hashimoto, and T. Onoye, An Analytic Evaluation on Soft Error Immunity Enhancement Due to Temporal Triplication, January 2018.
Detail of a work
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| R. Doi, M. Hashimoto, and T. Onoye, "An Analytic Evaluation on Soft Error Immunity Enhancement Due to Temporal Triplication," International Journal of Embedded Systems, 10(1), pp. 22-31, January 2018. | |
| ID | 429 |
| 分類 | 論文誌 |
| タグ | |
| 表題 (title) |
An Analytic Evaluation on Soft Error Immunity Enhancement Due to Temporal Triplication |
| 表題 (英文) |
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| 著者名 (author) |
R. Doi,M. Hashimoto,T. Onoye |
| 英文著者名 (author) |
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| キー (key) |
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| 定期刊行物名 (journal) |
International Journal of Embedded Systems |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
10 |
| 号数 (number) |
1 |
| ページ範囲 (pages) |
22-31 |
| 刊行月 (month) |
1 |
| 出版年 (year) |
2018 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | 利用できません． |
| BiBTeXエントリ |
@article{id429,
title = {An Analytic Evaluation on Soft Error Immunity Enhancement due to Temporal Triplication},
author = {R. Doi and M. Hashimoto and T. Onoye},
journal = {International Journal of Embedded Systems},
volume = {10},
number = {1},
pages = {22-31},
month = {1},
year = {2018},
}
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