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国際会議
[1] D. Alnajjar, H. Kounoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "MTTF Measurement under Alpha Particle Radiation in a Coarse-Grained Reconfigurable Architecture with Flexible Reliability," IEEE Workshop on Silicon Errors in Logic - System Effects (SELSE), March 2011.
[2] T. Kouno, M. Hashimoto, and H. Onodera, "Input Capacitance Modeling of Logic Gates for Accurate Static Timing Analysis," In Proceedings of IEEE Asian Solid-State Circuits Conference (A-SSCC), pages 453-456, November 2005. [52.pdf]