Detail of a work
Tweet | |
Y. Masuda, J. Nagayama, T. Cheng, T. Ishihara, Y. Momiyama, and M. Hashimoto, "Variation-Tolerant Voltage Over-Scalable Design with Critical Path Isolation and Bit-Width Scaling," International Workshop on Logic and Synthesis (IWLS), July 2020. | |
ID | 550 |
分類 | 国際会議 |
タグ | bit-width critical design isolation over-scalable path scaling variation-tolerant voltage |
表題 (title) |
Variation-Tolerant Voltage Over-Scalable Design with Critical Path Isolation and Bit-Width Scaling |
表題 (英文) |
|
著者名 (author) |
Y. Masuda,J. Nagayama,T. Cheng,T. Ishihara,Y. Momiyama,M. Hashimoto |
英文著者名 (author) |
Y. Masuda,,,,,M. Hashimoto |
キー (key) |
Y. Masuda,,,,,M. Hashimoto |
定期刊行物名 (journal) |
International Workshop on Logic and Synthesis (IWLS) |
定期刊行物名 (英文) |
|
巻数 (volume) |
|
号数 (number) |
|
ページ範囲 (pages) |
|
刊行月 (month) |
7 |
出版年 (year) |
2020 |
Impact Factor (JCR) |
|
URL |
|
付加情報 (note) |
|
注釈 (annote) |
|
内容梗概 (abstract) |
|
論文電子ファイル | 利用できません. |
BiBTeXエントリ |
@article{id550, title = {Variation-Tolerant Voltage Over-Scalable Design with Critical Path Isolation and Bit-Width Scaling}, author = {Y. Masuda and J. Nagayama and T. Cheng and T. Ishihara and Y. Momiyama and M. Hashimoto}, journal = {International Workshop on Logic and Synthesis (IWLS)}, month = {7}, year = {2020}, } |