Detail of a work
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| Y. Ogasahara, M. Hashimoto, and T. Onoye, "Dynamic Supply Noise Measurement with All Digital Gated Oscillator for Evaluating Decoupling Capacitance Effect," Proceedings of IEEE Custom Integrated Circuits Conference (CICC), pp. 783--786, September 2007. | |
| ID | 183 |
| 分類 | 国際会議 |
| タグ | |
| 表題 (title) |
Dynamic Supply Noise Measurement with All Digital Gated Oscillator for Evaluating Decoupling Capacitance Effect |
| 表題 (英文) |
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| 著者名 (author) |
Y. Ogasahara,M. Hashimoto,T. Onoye |
| 英文著者名 (author) |
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| キー (key) |
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| 定期刊行物名 (journal) |
Proceedings of IEEE Custom Integrated Circuits Conference (CICC) |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
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| 号数 (number) |
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| ページ範囲 (pages) |
783--786 |
| 刊行月 (month) |
9 |
| 出版年 (year) |
2007 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | 90.pdf (application/pdf) [一般閲覧可] |
| BiBTeXエントリ |
@article{id183,
title = {Dynamic Supply Noise Measurement with All Digital Gated Oscillator for Evaluating Decoupling Capacitance Effect},
author = {Y. Ogasahara and M. Hashimoto and T. Onoye},
journal = {Proceedings of IEEE Custom Integrated Circuits Conference (CICC)},
pages = {783--786},
month = {9},
year = {2007},
}
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