Detail of a work
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D. Fujimoto, Y. Kim, Y. Hayashi, N. Homma, M. Hashimoto, T. Sato, and J. Danger, "SASIMI: Evaluation Board for EM Information Leakage from Large Scale Cryptographic Circuits," IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity, August 2022. | |
ID | 609 |
分類 | 国際会議 |
タグ | board circuits cryptographic em evaluation information large leakage sasimi scale |
表題 (title) |
SASIMI: Evaluation Board for EM Information Leakage from Large Scale Cryptographic Circuits |
表題 (英文) |
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著者名 (author) |
D. Fujimoto, Y. Kim, Y. Hayashi, N. Homma, M. Hashimoto, T. Sato, J.-L. Danger |
英文著者名 (author) |
,,Y. Hayashi,,M. Hashimoto,T. Sato, |
キー (key) |
,,Y. Hayashi,,M. Hashimoto,T. Sato, |
定期刊行物名 (journal) |
IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity |
定期刊行物名 (英文) |
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巻数 (volume) |
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号数 (number) |
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ページ範囲 (pages) |
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刊行月 (month) |
8 |
出版年 (year) |
2022 |
Impact Factor (JCR) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | pdf (application/pdf) [一般閲覧可] |
BiBTeXエントリ |
@article{id609, title = {{SASIMI:} Evaluation Board for {EM} Information Leakage from Large Scale Cryptographic Circuits}, author = {D. Fujimoto and Y. Kim and Y. Hayashi and N. Homma and M. Hashimoto and T. Sato and J.-L. Danger}, journal = {IEEE International Symposium on Electromagnetic Compatibility \& Signal/Power Integrity}, month = {8}, year = {2022}, } |