: D. Fujimoto, Y. Kim, Y. Hayashi, N. Homma, M. Hashimoto, T. Sato, and J. Danger, SASIMI: Evaluation Board for EM Information Leakage from Large Scale Cryptographic Circuits, August 2022.
Detail of a work
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| D. Fujimoto, Y. Kim, Y. Hayashi, N. Homma, M. Hashimoto, T. Sato, and J. Danger, "SASIMI: Evaluation Board for EM Information Leakage from Large Scale Cryptographic Circuits," IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity, August 2022. | |
| ID | 609 |
| 分類 | 国際会議 |
| タグ | board circuits cryptographic em evaluation information large leakage sasimi scale |
| 表題 (title) |
SASIMI: Evaluation Board for EM Information Leakage from Large Scale Cryptographic Circuits |
| 表題 (英文) |
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| 著者名 (author) |
D. Fujimoto, Y. Kim, Y. Hayashi, N. Homma, M. Hashimoto, T. Sato, J.-L. Danger |
| 英文著者名 (author) |
,,Y. Hayashi,,M. Hashimoto,T. Sato, |
| キー (key) |
,,Y. Hayashi,,M. Hashimoto,T. Sato, |
| 定期刊行物名 (journal) |
IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
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| 号数 (number) |
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| ページ範囲 (pages) |
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| 刊行月 (month) |
8 |
| 出版年 (year) |
2022 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | pdf (application/pdf) [一般閲覧可] |
| BiBTeXエントリ |
@article{id609,
title = {{SASIMI:} Evaluation Board for {EM} Information Leakage from Large Scale Cryptographic Circuits},
author = {D. Fujimoto and Y. Kim and Y. Hayashi and N. Homma and M. Hashimoto and T. Sato and J.-L. Danger},
journal = {IEEE International Symposium on Electromagnetic Compatibility \& Signal/Power Integrity},
month = {8},
year = {2022},
}
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