List of works
この検索内の頻出タグ: 20-nm:2 characterization:2 comparative:2 muon-induced:2 neutrons:2 single-event:2 srams:2 upsets:2 alpha:1 alpha-particles:1 autonomous:1 behavior:1 bit:1 characteristics:1 construction:1 counter:1 countermeasures:1 cpu:1 cram:1 degradation:1 design:1 device:1 driving:1 erroneous:1 fpga:1 image-based:1 impact:1 lane:1 linear:1 model:1
- 論文誌
- [1] T. Tanaka, W. Liao, M. Hashimoto, and Y. Mitsuyama, "Impact of Neutron-Induced SEU in FPGA CRAM on Image-Based Lane Tracking for Autonomous Driving: from Bit Upset to SEFI and Erroneous Behavior," IEEE Transactions on Nuclear Science, volume 69, number 1, pages 35--42, January 2022. [pdf]
- [2] T. Kato, M. Tampo, S. Takeshita, H. Tanaka, H. Matsuyama, M. Hashimoto, and Y. Miyake, "Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization with Neutrons and Alpha Particles," IEEE Transactions on Nuclear Science, volume 68, number 7, pages 1436-1444, July 2021. [pdf]
- 国際会議
- [1] T. Tanaka, M. Hashimoto, and Y. Takeuchi, "Linear Programming Based Reliable Software Performance Model Construction with Noisy CPU Performance Counter Values," Proceedings of Workshop on Synthesis and System Integration of Mixed Technologies (SASIMI), March 2021.
- [2] T. Kato, M. Tampo, S. Takeshita, Y. Miyake, H Tanaka, and M. Hashimoto, "Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization with Neutrons and Alpha-Particles," IEEE Nuclear and Space Radiation Effects Conference (NSREC), November 2020.
- [3] Y. Akihara, T. Hirose, Y. Tanaka, N. Kuroki, M. Numa, and M. Hashimoto, "A Wireless Power Transfer System for Small-Sized Sensor Applications," Proceedings of International Conference on Solid State Devices and Materials (SSDM), pages 154--155, September 2015.
- 著書
- [1] T. Sato, M. Hashimoto, S. Tanakamaru, K. Takeuchi, Y. Sato, S. Kajihara, M. Yoshimoto, J. Jung, Y. Kimi, H. Kawaguchi, H. Shimada, and J. Yao, "Time-Dependent Degradation in Device Characteristics and Countermeasures by Design," Book chapter, VLSI Design and Test for Systems Dependability, Springer, August 2018.