: N. Banno, M. Tada, K. Okamoto, N. Iguchi, T. Sakamoto, H. Hada, H. Ochi, H. Onodera, M. Hashimoto, and T. Sugibayashi, 50x20 Crossbar Switch Block (CSB) with Two-Varistors (a-Si/SiN/a-Si) Selected Complementary Atom Switch for a Highly-Dense Reconfigurable Logic, December 2016.
Detail of a work
| Tweet | |
| N. Banno, M. Tada, K. Okamoto, N. Iguchi, T. Sakamoto, H. Hada, H. Ochi, H. Onodera, M. Hashimoto, and T. Sugibayashi, "50x20 Crossbar Switch Block (CSB) with Two-Varistors (a-Si/SiN/a-Si) Selected Complementary Atom Switch for a Highly-Dense Reconfigurable Logic," Technical Digest of IEEE International Electron Devices Meeting (IEDM), December 2016. | |
| ID | 443 |
| 分類 | 国際会議 |
| タグ | 50x20 a-si/sin/a-si atom block complementary crossbar csb highly-dense logic reconfigurable selected switch two-varistors |
| 表題 (title) |
50x20 Crossbar Switch Block (CSB) with Two-Varistors (a-Si/SiN/a-Si) Selected Complementary Atom Switch for a Highly-Dense Reconfigurable Logic |
| 表題 (英文) |
|
| 著者名 (author) |
N. Banno,M. Tada,K. Okamoto,N. Iguchi,T. Sakamoto,H. Hada,H. Ochi,H. Onodera,M. Hashimoto,T. Sugibayashi |
| 英文著者名 (author) |
N. Banno,M. Tada,K. Okamoto,N. Iguchi,T. Sakamoto,H. Hada,H. Ochi,H. Onodera,M. Hashimoto,T. Sugibayashi |
| キー (key) |
N. Banno,M. Tada,K. Okamoto,N. Iguchi,T. Sakamoto,H. Hada,H. Ochi,H. Onodera,M. Hashimoto,T. Sugibayashi |
| 定期刊行物名 (journal) |
Technical Digest of IEEE International Electron Devices Meeting (IEDM) |
| 定期刊行物名 (英文) |
|
| 巻数 (volume) |
|
| 号数 (number) |
|
| ページ範囲 (pages) |
|
| 刊行月 (month) |
12 |
| 出版年 (year) |
2016 |
| Impact Factor (JCR) |
|
| URL |
|
| 付加情報 (note) |
|
| 注釈 (annote) |
|
| 内容梗概 (abstract) |
|
| 論文電子ファイル | 231.PDF (application/pdf) [一般閲覧可] |
| BiBTeXエントリ |
@article{id443,
title = {50x20 Crossbar Switch Block {(CSB)} with Two-Varistors {(a-Si/SiN/a-Si)} selected Complementary Atom Switch for a highly-dense Reconfigurable Logic},
author = {N. Banno and M. Tada and K. Okamoto and N. Iguchi and T. Sakamoto and H. Hada and H. Ochi and H. Onodera and M. Hashimoto and T. Sugibayashi},
journal = {Technical Digest of IEEE International Electron Devices Meeting (IEDM)},
month = {12},
year = {2016},
}
|